Expertise
Multilayer
Annealing
Grazing Incidence
Reflectance
Annealing
X Rays
Laminates
X-Rays
Reflectivity
Incidence
Ion Scattering
Incidence
Energy
Organizations
Publications
Recent
Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H., & Bijkerk, F. (2018). Double matrix effect in Low Energy Ion Scattering from La surfaces. Applied surface science, 440, 570-579. DOI: 10.1016/j.apsusc.2018.01.174
Zameshin, A., Makhotkin, I. A., Yakunin, S. N., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2016). Reconstruction of interfaces of periodic multilayers from X-ray reflectivity using a free-form approach. Journal of applied crystallography, 49(4), 1300-1307. DOI: 10.1107/S160057671601044X
Zameshin, A., Yakshin, A., Sturm, J. M., Brongersma, H. H., & Bijkerk, F. (2016). Low Energy Ion Scattering from La surfaces. -.
Makhotkin, I. A., Zameshin, A., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2015). Characterization of nanoscale multilayer structures upon thermal annealing. Proceedings of SPIE - the international society for optical engineering, 9510(95100V), -. [95100V]. DOI: 10.1117/12.2182256
Zameshin, A., Makhotkin, I. A., Yakunin, S. N., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2015). Electron density profile determination for multilayers. -. Poster session presented at Physics@FOM Veldhoven 2015, Veldhoven, Netherlands.
UT Research Information System
Contact Details
Visiting Address
University of Twente
Faculty of Science and Technology
Carré
(building no. 15), room C2013
Hallenweg 23
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Science and Technology
Carré
C2013
P.O. Box 217
7500 AE Enschede
The Netherlands