dr. C.J. Lee (Chris) | University of Twente

Wavelengths

Thin Films

Hydrogen

Waveguides

Hydrogen

Carbon

Energy

Mirrors

Mund, B. K., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2018). Formation of H₂O on a CO₂ dosed Ru(0 0 0 1) surface under Extreme Ultraviolet Light and H₂. Applied surface science, 456, 538-544. DOI: 10.1016/j.apsusc.2018.06.166

Dolgov, A., Lee, C. J., Bijkerk, F., Abrikosov, A., Krivtsun, V. M., Lopaev, D., ... van Kampen, M. (2018). Plasma-assisted oxide removal from ruthenium-coated EUV optics. Journal of applied physics, 123(15), [153301]. DOI: 10.1063/1.5006771

Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J., & Bijkerk, F. (2018). Control of YH₃ formation and stability via hydrogen surface adsorption and desorption. Applied surface science, 455, 70-74. DOI: 10.1016/j.apsusc.2018.05.134

Van Den Bos, R. A. J. M., Reinink, J., Lopaev, D. V., Lee, C. J., Benschop, J. P. H., & Bijkerk, F. (2018). Influence of internal stress and layer thickness on the formation of hydrogen induced thin film blisters in Mo/Si multilayers. Journal of physics D: applied physics, 51(11), [115302]. DOI: 10.1088/1361-6463/aaad86

Mund, B. K., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2018). Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light. Applied surface science, 427(Part B), 1033-1040. DOI: 10.1016/j.apsusc.2017.09.098

van den Bos, R., Benschop, J., Bijkerk, F., & Lee, C. J. (2017). A model for hydrogen induced blister growth in Mo/Si multilayer mirror structures.

Milov, I., Makhotkin, I. A., Semin, S., Lee, C. J., Louis, E., Kimel, A., & Bijkerk, F. (2017). Nonequilibrium electron-phonon dynamics in ruthenium thin films exposed to ultra-short laser pulses.

Van Den Bos, R. A. J. M., Lee, C. J., Benschop, J. P. H., & Bijkerk, F. (2017). Blister formation in Mo/Si multilayered structures induced by hydrogen ions. Journal of physics D: applied physics, 50(26), [265302]. DOI: 10.1088/1361-6463/aa7323

Pachecka, M., Lee, C. J., Sturm, J. M., & Bijkerk, F. (2017). Metal diffusion properties of ultra-thin high-k Sc₂O₃ films. AIP advances, 7(10), [105324]. DOI: 10.1063/1.5000030

Pachecka, M., Lee, C. J., Sturm, J. M., & Bijkerk, F. (2017). Tin etching from metallic and oxidized scandium thin films. AIP advances, 7(8), [085107]. DOI: 10.1063/1.4991686

+31534892130 (if no answer)

c.j.lee@utwente.nl

Visiting Address

University of Twente
Drienerlolaan 5
7522 NB Enschede
The Netherlands

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Mailing Address

University of Twente
P.O. Box 217
7500 AE Enschede
The Netherlands

University of Twente Drienerlolaan 5
7522 NB Enschede

+31 (0)53 489 9111
info@utwente.nl
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