dr. C.J. Lee (Chris) | University of Twente

Waveguides

Mirrors

Wavelengths

Semiconductor Lasers

Cavities

Wavelength

Silicon Nitrides

Hydrogen

Dolgov, A., Lee, C. J., Bijkerk, F., Abrikosov, A., Krivtsun, V. M., Lopaev, D., ... van Kampen, M. (2018). Plasma-assisted oxide removal from ruthenium-coated EUV optics. Journal of applied physics, 123(15), [153301]. DOI: 10.1063/1.5006771

Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J., & Bijkerk, F. (2018). Control of YH₃ formation and stability via hydrogen surface adsorption and desorption. Applied surface science, 455, 70-74. DOI: 10.1016/j.apsusc.2018.05.134

Van Den Bos, R. A. J. M., Reinink, J., Lopaev, D. V., Lee, C. J., Benschop, J. P. H., & Bijkerk, F. (2018). Influence of internal stress and layer thickness on the formation of hydrogen induced thin film blisters in Mo/Si multilayers. Journal of physics D: applied physics, 51(11), [115302]. DOI: 10.1088/1361-6463/aaad86

Mund, B. K., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2018). Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light. Applied surface science, 427(Part B), 1033-1040. DOI: 10.1016/j.apsusc.2017.09.098

van den Bos, R., Benschop, J., Bijkerk, F., & Lee, C. J. (2017). A model for hydrogen induced blister growth in Mo/Si multilayer mirror structures.

Milov, I., Makhotkin, I. A., Semin, S., Lee, C. J., Louis, E., Kimel, A., & Bijkerk, F. (2017). Nonequilibrium electron-phonon dynamics in ruthenium thin films exposed to ultra-short laser pulses.

Van Den Bos, R. A. J. M., Lee, C. J., Benschop, J. P. H., & Bijkerk, F. (2017). Blister formation in Mo/Si multilayered structures induced by hydrogen ions. Journal of physics D: applied physics, 50(26), [265302]. DOI: 10.1088/1361-6463/aa7323

Pachecka, M., Lee, C. J., Sturm, J. M., & Bijkerk, F. (2017). Metal diffusion properties of ultra-thin high-k Sc₂O₃ films. AIP advances, 7(10), [105324]. DOI: 10.1063/1.5000030

Pachecka, M., Lee, C. J., Sturm, J. M., & Bijkerk, F. (2017). Tin etching from metallic and oxidized scandium thin films. AIP advances, 7(8), [085107]. DOI: 10.1063/1.4991686

Shaheen, A., Sturm, J. M., Ricciardi, R., Huskens, J., Lee, C. J., & Bijkerk, F. (2017). Characterization of self-assembled monolayers on a ruthenium surface. Langmuir, 33(25), 6419-6429. DOI: 10.1021/acs.langmuir.7b01068

+31534892130 (if no answer)

c.j.lee@utwente.nl

Visiting Address

University of Twente
Drienerlolaan 5
7522 NB Enschede
The Netherlands

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University of Twente
P.O. Box 217
7500 AE Enschede
The Netherlands

University of Twente Drienerlolaan 5
7522 NB Enschede

+31 (0)53 489 9111
info@utwente.nl
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