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Recent Articles
Van Den Bos, R. A. J. M., Reinink, J., Lopaev, D. V., Lee, C. J., Benschop, J. P. H., & Bijkerk, F. (2018). Influence of internal stress and layer thickness on the formation of hydrogen induced thin film blisters in Mo/Si multilayers. Journal of physics D: applied physics, 51(11), [115302]. DOI: 10.1088/1361-6463/aaad86
Mund, B. K., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2018). Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light. Applied surface science, 427(Part B), 1033-1040. DOI: 10.1016/j.apsusc.2017.09.098
Van Den Bos, R. A. J. M., Lee, C. J., Benschop, J. P. H., & Bijkerk, F. (2017). Blister formation in Mo/Si multilayered structures induced by hydrogen ions. Journal of physics D: applied physics, 50(26), [265302]. DOI: 10.1088/1361-6463/aa7323
Pachecka, M., Lee, C. J., Sturm, J. M., & Bijkerk, F. (2017). Metal diffusion properties of ultra-thin high-k Sc2O3 films. AIP advances, 7(10), [105324]. DOI: 10.1063/1.5000030
Pachecka, M., Lee, C. J., Sturm, J. M., & Bijkerk, F. (2017). Tin etching from metallic and oxidized scandium thin films. AIP advances, 7(8), 1-8. [085107]. DOI: 10.1063/1.4991686
Shaheen, A., Sturm, J. M., Ricciardi, R., Huskens, J., Lee, C. J., & Bijkerk, F. (2017). Characterization of self-assembled monolayers on a ruthenium surface. Langmuir, 33(25), 6419-6429. DOI: 10.1021/acs.langmuir.7b01068
Liu, F., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2017). Coexistence of ice clusters and liquid-like water clusters on the Ru(0001) surface. Physical chemistry chemical physics (PCCP), 19(12), 8288-8299. DOI: 10.1039/C6CP07369G
Pachecka, M., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2017). Adsorption and Dissociation of CO2 on Ru (0001). Journal of physical chemistry, 6729-6735. DOI: 10.1021/acs.jpcc.7b00021
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