Expertise
Chemistry
# Thermal Cycling
Engineering & Materials Science
# Failure Modes
# Hot Temperature
# Identification (Control Systems)
# Radio Frequency Identification (Rfid)
# Specifications
# Temperature
# Thermal Cycling
Organisations
Publications
Recent
Ozturk, E.
, Dikkers, M. J.
, Batenburg, K. M.
, Salm, C.
, & Schmitz, J. (2020).
RFID Tag Failure after Thermal Overstress. In
2019 IEEE International Integrated Reliability Workshop, IIRW 2019 Article 8989885 IEEE.
https://doi.org/10.1109/IIRW47491.2019.8989885
UT Research Information System
Contact Details
Visiting Address
University of Twente
Faculty of Engineering Technology
Horst Complex
(building no. 20), room W200
De Horst 2
7522LW Enschede
The Netherlands
University of Twente
Faculty of Engineering Technology
Horst - Ring
(building no. 21)
De Horst 2
7522LW Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Engineering Technology
Horst - Ring
P.O. Box 217
7500 AE Enschede
The Netherlands