Welcome...

H.A.G.M. van Wolferen (Henk)

Operator Focused Ion Beam and BioNanoLab

About Me

Focused Ion Beam: TEM-Sample preparation, Cross-sectioning and Patterning

BioNanoLab: Support for Mass spectrometer with MALDI and ESI, FluidFM and NSOM

Expertise

Scanning Electron Microscopy
Scanning Electron Microscopy
Experiments
Experiments
Microscopes
Microscopes
Dimers
Electron Beams
Illumination
Scanning Electron Microscopy
Electron Microscopes
Nanostructures
Quantitative Analysis
Chemical Analysis
Dimers
Nanoparticles
Nanoparticles
Nanoparticles
Focused Ion Beams
Raman Spectroscopy
Electron Microscopy
Microscopic Examination
Electron Microscopes
Nanoparticle
Focused Ion Beams
Resonators
Microscopic Examination
Raman Spectroscopy
Resonators
Whispering Gallery Modes
Chemical Analysis

Research

Laser Interference Lithography.

Focused Ion Beam for TEM-Sample preparation, Cross-sectioning and patterning

Mass spectrometry with MALDI and ESI

FluidFM

NSOM

Publications

Recent
Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. -. Poster session presented at Physics of X-Ray and Neutron Multilayer Structures workshop 2016, Enschede, Netherlands.
Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. -.

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Nanolab (building no. 16), room 1050
Hallenweg 23
7522NH  Enschede
The Netherlands

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University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Horst - Zuidhorst (building no. 28), room 152
De Horst 2
7522LW  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Horst - Zuidhorst  152
P.O. Box 217
7500 AE Enschede
The Netherlands