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H.A.G.M. van Wolferen (Henk)

Support technician for Focused Ion Beam adn BioNanoLab

About Me

Focused Ion Beam: TEM-Sample preparation, Cross-sectioning and Patterning

BioNanoLab: Support for Mass spectrometer with MALDI and ESI, FluidFM and NSOM

Expertise

Lasers
Lithography
Gratings
Lithography
Silicon
Interference
Bragg Reflectors
Gases

Research

Laser Interference Lithography.

Focused Ion Beam for TEM-Sample preparation, Cross-sectioning and patterning

Mass spectrometry with MALDI and ESI

FluidFM

NSOM

Publications

Recent
Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. -.
Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. -.

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Nanolab (building no. 16), room 1050
Hallenweg 23
7522NH  Enschede
The Netherlands

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University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Horst - Zuidhorst (building no. 28), room 152
De Horst 2
7522LW  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Horst - Zuidhorst  152
P.O. Box 217
7500 AE Enschede
The Netherlands