Welcome...

H. Ebrahimi MSc (Hassan)

PhD Candidate / PhD Student

Expertise

Defects
Avionics
Hardware
Testing
Costs
Temperature
System-On-Chip
Cracks
Ball Grid Arrays
Circuit Simulation

Publications

Recent Articles
Rohani, A., Ebrahimi, H., & Kerkhoff, H. G. (2016). A software framework to calculate local temperatures in CMOS processors. 183-188. Paper presented at 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, Bremen, Germany.DOI: 10.1109/PATMOS.2016.7833685
Ebrahimi, H., & Kerkhoff, H. G. (2016). Testing for intermittent resistive faults in CMOS integrated systems. In IEEE 2016 Euromicro Conference on Digital System Design (DSD) (pp. 703-707). USA: IEEE Circuits & Systems Society. DOI: 10.1109/DSD.2016.58
Ebrahimi, H., Kerkhoff, H. G., & Rohani, A. (2016). Detecting intermittent resistive faults in digital CMOS circuits. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 87-90). USA: IEEE Computer Society. DOI: 10.1109/DFT.2016.7684075
Kerkhoff, H. G., & Ebrahimi, H. (2015). Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard. In 6th Asia Symposium on Quality Electronic Design, ASQED 2015 (pp. 77-82). USA: IEEE Circuits & Systems Society. DOI: 10.1109/ACQED.2015.7274011
Kerkhoff, H. G., & Ebrahimi, H. (2015). Intermittent resistive faults in digital cmos circuits. In IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015 (pp. 211-216). USA: IEEE Circuits & Systems Society. DOI: 10.1109/DDECS.2015.12

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling (building no. 11), room 5034
Hallenweg 19
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling  5034
P.O. Box 217
7500 AE Enschede
The Netherlands