Expertise
Engineering & Materials Science
# Aging Of Materials
# Cyber Physical System
# Fault Detection
# Ieee Standards
# Monitoring
# Network-On-Chip
# System-On-Chip
Mathematics
# System-On-Chip
Publications
Recent
Ebrahimi, H.
, & Kerkhoff, H. G. (2020).
A New Monitor Insertion Algorithm for Intermittent Fault Detection. In
2020 IEEE European Test Symposium, ETS 2020 [9131563] (Proceedings of the European Test Workshop; Vol. 2020-May). IEEE.
https://doi.org/10.1109/ETS48528.2020.9131563
Ali, G.
, Bagheriye, L., Manhaeve, H.
, & Kerkhoff, H. G. (2020).
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. In
IEEE Asian Test Symposium, ATS 2020 (IEEE Asian Test Symposium (ATS); Vol. 2020, No. 29). IEEE.
https://doi.org/10.1109/ATS49688.2020.9301509
Bagheriye, L.
, Ali, G.
, & Kerkhoff, H. G. (2020).
Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. In
IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020 (pp. 1-4). (IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS); Vol. 2020, No. 26). IEEE.
https://doi.org/10.1109/IOLTS50870.2020.9159753
Ali, G.
, Bagheriye, L.
, & Kerkhoff, H. G. (2020).
On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. In
IEEE International Symposium on Circuits and Systems, ISCAS 2020 (pp. 1-5). (IEEE International Symposium on Circuits and Systems (ISCAS); Vol. 2020). IEEE.
https://doi.org/10.1109/ISCAS45731.2020.9180773
Ebrahimi, H.
, & Kerkhoff, H. G. (2019).
A Digital On-Line Monitor for Detecting Intermittent Resistance Faults at Board Level.
Journal of circuits, systems and computers,
28, [1940003].
https://doi.org/10.1142/S0218126619400036
Ibrahim, A. M. Y.
, & Kerkhoff, H. G. (2019).
DARS: An EDA framework for reliability and functional safety management of system-on-chips. In
2019 IEEE International Test Conference, ITC 2019 [9000112] (Proceedings - International Test Conference; Vol. 2019-November). IEEE.
https://doi.org/10.1109/ITC44170.2019.9000112
Pathrose, J., Van De Logt, L.
, & Kerkhoff, H. G. (2019).
Analog test interface for IEEE 1687 employing split SAR architecture to support embedded instrument dependability applications. In
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 [8875372] IEEE.
https://doi.org/10.1109/DFT.2019.8875372
Zhao, Y. (2019).
Health monitoring and life-time prognostics to enable dependable many-processor S0Cs. University of Twente.
https://doi.org/10.3990/1.9789036549165
Ibrahim, A. M. Y.
, & Kerkhoff, H. G. (2019).
An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. In
2019 IEEE International Test Conference in Asia (ITC-Asia) (pp. 109-114). [8871531] IEEE.
https://doi.org/10.1109/ITC-Asia.2019.00032
Wan, J. (2019).
Ageing and embedded instrument monitoring of analogue/mixed-signal IPS. University of Twente.
https://doi.org/10.3990/1.9789036548298
Contact Details
Visiting Address
University of Twente
Drienerlolaan 5
7522 NB Enschede
The Netherlands
Mailing Address
University of Twente
P.O. Box 217
7500 AE Enschede
The Netherlands