University of Twente
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dr.ir. H.G. Kerkhoff (Hans)

Associate Professor

Expertise

Testing
Sensors
Defects
System-On-Chip
Fluidics
Digital To Analog Conversion
Hardware
Monitoring

Organizations

Publications

Recent
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp. 1-2). IEEE. DOI: 10.1109/IOLTS.2017.8046166
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). Structured Scan Patterns Retargeting for Dynamic Instruments Access. In 2017 IEEE 35th VLSI Test Symposium (VTS) IEEE. DOI: 10.1109/VTS.2017.7928955
Rohani, A., Ebrahimi, H., & Kerkhoff, H. G. (2016). A software framework to calculate local temperatures in CMOS processors. 183-188. Paper presented at 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, Bremen, Germany.DOI: 10.1109/PATMOS.2016.7833685
Kerkhoff, H. G., & Ebrahimi, H. (2016). Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. Journal of circuits, systems and computers, 25(03), [1640023]. DOI: 10.1142/S0218126616400235
Wan, J. (Ed.), Wan, J. (Ed.), & Kerkhoff, H. G. (2016). Simulating NBTI degradation in arbitrary stressed analog/mixed-signal environments. IEEE transactions on nanotechnology, 15(2), 137-148. DOI: 10.1109/TNANO.2015.2505092
Ali, G., Badawy, A., & Kerkhoff, H. G. (2016). Accessing on-chip temperature health monitors using the IEEE 1687 standard. 776-779. DOI: 10.1109/ICECS.2016.7841317
Zhao, Y. (Ed.), & Kerkhoff, H. G. (2016). Highly dependable multi-processor SoCs employing lifetime prediction based on health monitors. 228-233. DOI: 10.1109/ATS.2016.30
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 97-102). USA: IEEE Computer Society. DOI: 10.1109/DFT.2016.7684077
Alt, J., Bernardi, P., Bosio, A., Cantoro, R., Kerkhoff, H. G., Leininger, A., ... Strasser, S. (2016). Thermal issues in test: An overview of the significant aspects and industrial practice. In IEEE 34th VLSI Test Symposium (VTS 2016) (pp. 1-4). USA: IEEE. DOI: 10.1109/VTS.2016.7477278
Ebrahimi, H., & Kerkhoff, H. G. (2016). Testing for intermittent resistive faults in CMOS integrated systems. In IEEE 2016 Euromicro Conference on Digital System Design (DSD) (pp. 703-707). USA: IEEE Circuits & Systems Society. DOI: 10.1109/DSD.2016.58

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Contact Details

+31534893770  (if no answer)
 
 

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling (building no. 11), room 5078
Hallenweg 19
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling  5078
P.O. Box 217
7500 AE Enschede
The Netherlands

Organizations

University of Twente Drienerlolaan 5
7522 NB Enschede
+31 (0)53 489 9111
info@utwente.nl
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