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dr.ir. H.G. Kerkhoff (Hans)

Associate Professor

Expertise

Testing
Sensors
Defects
System-On-Chip
Fluidics
Digital To Analog Conversion
Hardware
Monitoring

Publications

Recent
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2017). A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp. 1-2). IEEE. DOI: 10.1109/IOLTS.2017.8046166
Rohani, A., Ebrahimi, H., & Kerkhoff, H. G. (2016). A software framework to calculate local temperatures in CMOS processors. 183-188. Paper presented at 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, Bremen, Germany.DOI: 10.1109/PATMOS.2016.7833685
Ibrahim, A. M. Y., & Kerkhoff, H. G. (2016). Efficient Utilization of Hierarchical iJTAG Networks for Interrupts Management. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 97-102). USA: IEEE Computer Society. DOI: 10.1109/DFT.2016.7684077
Alt, J., Bernardi, P., Bosio, A., Cantoro, R., Kerkhoff, H. G., Leininger, A., ... Strasser, S. (2016). Thermal issues in test: An overview of the significant aspects and industrial practice. In IEEE 34th VLSI Test Symposium (VTS 2016) (pp. 1-4). USA: IEEE. DOI: 10.1109/VTS.2016.7477278
Ebrahimi, H., & Kerkhoff, H. G. (2016). Testing for intermittent resistive faults in CMOS integrated systems. In IEEE 2016 Euromicro Conference on Digital System Design (DSD) (pp. 703-707). USA: IEEE Circuits & Systems Society. DOI: 10.1109/DSD.2016.58

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling (building no. 11), room 5078
Hallenweg 19
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling  5078
P.O. Box 217
7500 AE Enschede
The Netherlands