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dr.ir. M. Ottavi (Marco)

Associate Professor

About Me

Marco Ottavi graduated in Electronic Engineering at the University of Rome "La Sapienza,” and obtained a doctorate in Telecommunications and Microelectronics Engineering at the University of Rome "Tor Vergata.” From 2003 to 2007, he was visiting scholar and research associate at Northeastern University in Boston (USA). In 2006 he was visiting research scholar at Sandia National Laboratories in Albuquerque (USA). In 2007 he was granted permanent residence in the United States ("green card") with the EB1 visa for "outstanding researchers.” From 2007 to 2009, he was Senior Design Engineer at Advanced Micro Devices (AMD) in Boxborough (USA). In 2009 he joined the University of Rome "Tor Vergata" as the winner of a "Rientro dei Cervelli" scholarship; since 2014, he has been Associate Professor at the same university. In 2021 he joined the Computer Architecture for Embedded Systems (CAES) group as an Associate Professor. 

Expertise

Engineering & Materials Science
Cellular Automata
Data Storage Equipment
Electric Power Utilization
Error Correction
Memristors
Networks (Circuits)
Reduced Instruction Set Computing
Switches

Research

My research focuses on dependable computing systems based on emerging technologies and paradigms. On these topics, I have published more than 150 contributions to international congresses and journals, of which I am also a reviewer and organizer. From 2011 to 2015, I coordinated the European project COST IC1103 MEDIAN (Manufacturable and Dependable Multicore Architectures at Nanoscale). I serve and have served as Associate Editor for IEEE Transactions on Emerging Topics in Computing, IEEE Transactions on Nanotechnology, and IEEE Nanotechnology Magazine. I am a senior member of IEEE.

Publications

Recent
Uchoa, H., Arora, V., Vermoen, D. , Ottavi, M. , & Alachiotis, N. (2023). Exploring Genomic Sequence Alignment for Improving Side-Channel Analysis. In G. Tsudik, M. Conti, K. Liang, & G. Smaragdakis (Eds.), Computer Security – ESORICS 2023: 28th European Symposium on Research in Computer Security, The Hague, The Netherlands, September 25–29, 2023, Proceedings, Part III (pp. 203-221). (Lecture Notes in Computer Science; Vol. 14346). Springer. https://doi.org/10.1007/978-3-031-51479-1
Palumbo, A. , Ottavi, M., & Cassano, L. (2023). Built-in Software Obfuscation for Protecting Microprocessors against Hardware Trojan Horses. In L. Cassano, M. Psarakis, M. Traiola, & A. Bosio (Eds.), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; Vol. 36). IEEE. https://doi.org/10.1109/DFT59622.2023.10313534
Böhmer, K., Forlin, B., Cazzaniga, C., Rech, P., Furano, G. , Alachiotis, N. , & Ottavi, M. (2023). Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs. In L. Cassano, M. Psarakis, M. Traiola, & A. Bosio (Eds.), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; Vol. 36). IEEE. https://doi.org/10.1109/DFT59622.2023.10313556
Palumbo, A., Cassano, L., Reviriego, P. , & Ottavi, M. (2023). Improving the Detection of Hardware Trojan Horses in Microprocessors via Hamming Codes. In L. Cassano, M. Psarakis, M. Traiola, & A. Bosio (Eds.), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; Vol. 36). IEEE. https://doi.org/10.1109/DFT59622.2023.10313563
Nikiema, P. R., Palumbo, A., Aasma, A., Cassano, L., Kritikakou, A., Kulmala, A., Lukkarila, J. , Ottavi, M., Psiakis, R., & Traiola, M. (2023). Towards Dependable RISC-V Cores for Edge Computing Devices. In A. Savino, M. Maniatakos, S. di Carlo, & D. Gizopoulos (Eds.), 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) (Proceedings - 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023). IEEE. https://doi.org/10.1109/IOLTS59296.2023.10224862
Bolat, A., Tugrul, Y. C., Celik, S. H., Sezer, S. , Ottavi, M., & Ergin, O. (2023). DEV-PIM: Dynamic Execution Validation with Processing-in-Memory. In Proceedings - 2023 IEEE European Test Symposium, ETS 2023 (Proceedings of the European Test Workshop; Vol. 2023-May). IEEE. https://doi.org/10.1109/ETS56758.2023.10174063
Forlin, B. E., van Huffelen, W., Cazzaniga, C., Rech, P. , Alachiotis, N. , & Ottavi, M. (2023). An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds? In Proceedings - 2023 IEEE European Test Symposium, ETS 2023 (Proceedings IEEE European Test Symposium (ETS); Vol. 2023). IEEE. https://doi.org/10.1109/ETS56758.2023.10174076
Ebrahimi, H. (2023). Design and verification of embedded instruments for detecting intermittent resistive faults in electronic systems. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036557603
Barbirotta, M., Cheikh, A., Mastrandrea, A., Menichelli, F. , Ottavi, M., & Olivieri, M. (2023). Evaluation of Dynamic Triple Modular Redundancy in an Interleaved-Multi-Threading RISC-V Core. Journal of Low Power Electronics and Applications, 13(1). https://doi.org/10.3390/jlpea13010002
Annink, E. B., Rauwerda, G., Hakkennes, E., Menicucci, A., Mascio, S. D., Furano, G. , & Ottavi, M. (2022). Preventing Soft Errors and Hardware Trojans in RISC-V Cores. In L. Cassano, S. Chakravarty, & A. Bosio (Eds.), Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; Vol. 2022-October). IEEE. https://doi.org/10.1109/DFT56152.2022.9962340
Cassano, L., Mascio, S. D., Palumbo, A., Menicucci, A., Furano, G., Bianchi, G. , & Ottavi, M. (2022). Is RISC-V ready for Space? A Security Perspective. In L. Cassano, S. Chakravarty, & A. Bosio (Eds.), Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; Vol. 2022-October). IEEE. https://doi.org/10.1109/DFT56152.2022.9962352
Bala, A., Khandelwal, S., Jabir, A. , & Ottavi, M. (2022). Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability. In A. Savino, P. Rech, S. Di Carlo, & D. Gizopoulos (Eds.), 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) IEEE. https://doi.org/10.1109/IOLTS56730.2022.9897183
Coluccio, A., Ieva, A., Riente, F., Roch, M. R. , Ottavi, M., & Vacca, M. (2022). RISC-Vlim, a RISC-V Framework for Logic-in-Memory Architectures. Electronics, 11(19), Article 2990. https://doi.org/10.3390/electronics11192990
Khandelwal, S. , Ottavi, M., Martinelli, E., & Jabir, A. (2022). Low power memristive gas sensor architectures with improved sensing accuracy. Journal of Computational Electronics, 21(4), 1005-1016. https://doi.org/10.1007/s10825-022-01890-0
Bolat, A., Celik, S. H., Olgun, A., Ergin, O. , & Ottavi, M. (2022). ERIC: An Efficient and Practical Software Obfuscation Framework. In Proceedings - 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022 (pp. 466-474). (Proceedings - Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022; Vol. 2022). IEEE. https://doi.org/10.1109/DSN53405.2022.00053
Arikan, K., Palumbo, A., Cassano, L., Reviriego, P., Pontarelli, S., Bianchi, G., Ergin, O. , & Ottavi, M. (2022). Processor Security: Detecting Microarchitectural Attacks via Count-Min Sketches. IEEE transactions on very large scale integration (VLSI) systems, 30(7), 938-951. https://doi.org/10.1109/TVLSI.2022.3171810
Palumbo, A., Cassano, L., Luzzi, B., Hernández, J. A., Reviriego, P., Bianchi, G. , & Ottavi, M. (2022). Is your FPGA bitstream Hardware Trojan-free? Machine learning can provide an answer. Journal of systems architecture, 128, Article 102543. https://doi.org/10.1016/j.sysarc.2022.102543
De Rossi, F., Taheri, B., Bonomo, M., Gupta, V., Renno, G., Yaghoobi Nia, N., Rech, P., Frost, C., Cazzaniga, C., Quagliotto, P., Di Carlo, A., Barolo, C. , Ottavi, M., & Brunetti, F. (2022). Neutron irradiated perovskite films and solar cells on PET substrates. Nano Energy, 93, Article 106879. https://doi.org/10.1016/j.nanoen.2021.106879
Gupta, V., Panunzi, G., Khandelwal, S., Martinelli, E., Jabir, A. , & Ottavi, M. (2021). Reliability Assessment of Memristor based Gas Sensor Array. In L. Dilillo, L. Cassano, & A. Papadimitriou (Eds.), 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 1-6). Article 9568304 (IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT); Vol. 2021). IEEE. https://doi.org/10.1109/DFT52944.2021.9568304
Palumbo, A., Cassano, L., Reviriego, P., Bianchi, G. , & Ottavi, M. (2021). A Lightweight Security Checking Module to Protect Microprocessors against Hardware Trojan Horses. In L. Dilillo, L. Cassano, & A. Papadimitriou (Eds.), 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 1-6). Article 9568291 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; Vol. 2021-October). IEEE. https://doi.org/10.1109/DFT52944.2021.9568291
Chattopadhyay, S., Santikellur, P., Chakraborty, R. S., Mathew, J. , & Ottavi, M. (2021). A Conditionally Chaotic Physically Unclonable Function Design Framework with High Reliability. ACM transactions on design automation of electronic systems, 26(6), Article 3460004. https://doi.org/10.1145/3460004
Gnoli, L., Riente, F. , Ottavi, M., & Vacca, M. (2021). A memristor-based sensing and repair system for photovoltaic modules. Microelectronics reliability, 117, Article 114026. https://doi.org/10.1016/j.microrel.2020.114026

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Affiliated Study Programmes

Master

Courses Academic Year  2023/2024

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
 

Courses Academic Year  2022/2023

Projects

The Dependable Computing Systems Group is currently involved in the following research activity.

Current Projects

News on utwente.nl

This memorandum of understanding between the European Space Agency (ESA) and the University of Twente will enhance our collaboration on designing and characterizing dependable computing systems for space applications.
https://www.utwente.nl/en/eemcs/news/2024/3/1392853/formalising-collaboration-with-the-european-space-agency

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Contact Details

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling (building no. 11), room 5039
Hallenweg 19
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling  5039
P.O. Box 217
7500 AE Enschede
The Netherlands

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