Welcome...

S. Banerjee MSc (Sourish)

Expertise

Gallium
Ammonia
Gallium Nitrides
Pulses
Heterojunctions
Diodes
Electroluminescence
Charge Carriers
Diodes
Continuity
Wire
Silicon
Diodes
Silicon
Spectroscopic Ellipsometry
Conduction

Publications

Recent
Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J., & Kovalgin, A. Y. (2017). Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. In Electrical test structures for verifying continuity of ultra-thin insulating and conducting films (pp. 1-6). New York: IEEE. DOI: 10.1109/ICMTS.2017.7954258

Contact Details

Visiting Address

University of Twente
Drienerlolaan 5
7522 NB Enschede
The Netherlands

Navigate to location

Mailing Address

University of Twente
P.O. Box 217
7500 AE Enschede
The Netherlands

Social Media