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dr.ir. U. Celano PhD (Umberto)

Assistant Professor

About Me

 

Dr. Umberto Celano is an assistant professor with the Faculty of Science and Technology at the University of Twente (Netherlands) and principal member of technical staff at imec (Belgium). His research agenda is focused on nanoelectronics at the interface of condensed matter physics, materials analysis, and semiconductor technology. He studies emerging devices and their physics with emphasis on the design and development of characterization methods for new materials, failure analysis, and correlative metrology. As such, his work is inherently multidisciplinary in nature blending device physics, and reliability with materials science and metrology.

Umberto Celano is a trained electrical engineer from the University of Rome Sapienza (Italy). After a master’s in nanoelectronics, he joined imec for his PhD in the laboratory of Wilfried Vandervorst (2010) where he got interested in materials analysis for semiconductor technology. During this period, he mastered multiple analytical techniques and focused on scanning probe microscopies, working to establish a novel three-dimensional nanoscale imaging technique to study materials in confined volumes (this work got him the 2013 IEDM Roger Haken Award). He received his Ph.D. in Physics from the University of Leuven - KU Leuven (Belgium) in 2015. Later, he joined imec as a permanent researcher, contributing in various roles to the materials/process development and characterization of advanced logic and memory devices. In 2018, he was a visiting scientist with the Geballe Laboratory for Advanced Materials at Stanford University where he expanded his research interest to functional materials in the realm of nanophotonic. 

 

 

CURRICULUM VITAE

Oct. 2020 – Present (part-time) 

  • Asst. Professor at the Faculty of Science and Technology and MESA+ Institute for Nanotechnology– University of Twente

May 2019 – Present

  • Principal Member of Technical Staff, Interuniversitair Micro-Electronica Centrum (imec) – Leuven, Belgium

May 2018 – May 2019

  • Visiting Scientist - Stanford University, the Geballe Laboratory for Advanced Materials

Jan 2016 – Jan 2018

  • Research Scientist - Interuniversitair Micro-Electronica Centrum (imec) – Leuven, Belgium

June 2011 – Dec 2015

  • Ph.D. in Physics – KU Leuven, Dept. of Physics and Astronomy (Leuven, Belgium) Dissertation: “Metrology and Physical Mechanisms in New Generation Ionic Devices”

 

SELECTED OTHER ACTIVITIES:

  • AVS executive committee member for the “Nanoscale Science and Technology Division” (2019 – present)
  • Member of the IEEE International Roadmap for Devices and Systems (IRDS) (2014 – present)
  • SEMI standards committee member for doping in advanced CMOS technology (2018-2019)
  • Member of Nano Letters young career editorial board (2015 – 2019)

 

AWARDS AND RECOGNITIONS

  • PhD dissertation selected for the Springer Theses books collection (2016)
  • Honorable mention for PhD Thesis from KU Leuven - Science@Leuven (2016)
  • Best Paper at INC10 – NIST Gaithersburg, MD (2014)       
  • imec PhD Excellence award – 3 winners on 250 imec PhDs (2014)
  • Roger A. Haken Award at the International Electron Devices Meeting IEDM 2013

Expertise

Engineering & Materials Science
Charge Injection
Ferroelectric Materials
Hafnium
Nanowires
Vacancies
Chemistry
Kelvin Probe Force Microscopy
Physics & Astronomy
Spin Resonance
Zirconates

Publications

Other Contributions

SELECTED KEY PUBLICATIONS (in reverse chronological order)

 

Celano, U., Zhong, H., Ciubotaru, F., et al., Probing Magnetic Defects in Ultra-Scaled Nanowires with Optically Detected Spin Resonance in Nitrogen-Vacancy Center in Diamond, Nano Letters, 2021, (DOI:10.1021/acs.nanolett.1c03723)                                                                                         

Wang, Y., Landreman, P., Schoen, D., Okabe, K., Marshall, A., Celano, U., Wong, H-S. P., Park, J., Brongersma, M., Electrical tuning of phase-change antennas and metasurfaces, Nature Nanotechnology, 2021, 16, 667-672                                                                                  

Van de Groep, J., Song, J., Celano, U., Kik, P., Brongersma, M., Exciton Resonance Tuning of an Atomically-thin Lens, Nature Photonics, 2020, 14, 426–430                                              

Brown, K. A., Brittman, S., Maccaferri, N., Jariwala, D., Celano U., Machine Learning in Nanoscience: Big Data at Small Scales, Nano Letters, 2020, 20, 1, 2                                        

N. G. Orji, M. Badaroglu, B. M. Barnes, C. Beitia, B. D. Bunday, U. Celano, R. J. Kline, M. Neisser, Y. Obeng, A. E. Vladar, Metrology for the next generation of semiconductor devices, Nature Electronics, 2018, 1, 532–547                                                                             

Celano, U., Nagashima, K., Koga, H., Nogi, M., Suganuma, M., Zhuge, F., Meng, G., He, Y., Fantini, A., De Boeck, J., Jurczak, M., Vandervorst, W., Yanagida, T., All Nanocellulose Nonvolatile Resistive Memory, NPG Asia Materials,  2016, 8                                                      

Celano, U., Goux, L., Degraeve, R., Richard, O., Bender, H., Jurczak, M., Vandervorst, W., Imaging in the three-dimension the conductive channel in filamentary-based oxide resistive switching memory, Nano Letters, 2015, 15(12), 7970                                                  

Celano, U., Hantschel, T., Giammaria, G., Chintala, R., Conard, T., Bender, H., Vandervorst, W. Evaluation of the electrical contact area in contact-mode scanning probe microscopy, Journal of Applied Physics, 2015, 117, 214305                                                                             

Celano, U., Goux, L., Belmonte, A., Opsomer, K., Franquet, A., Schulze, A., Detavernier, C., Richard, O., Bender, H., Jurczak, M., Vandervorst, W., Three-dimensional observation of the conductive filament in nanoscaled resistive memory devices, Nano Letters, 2014, 14, 2401


BOOKS EDITED: 
Electrical Atomic Force Microscopy for Nanoelectronics, 2019, Springer International Publishing, (ISBN: 978-3-030-15612-1)

Metrology and Physical Mechanisms in New Generation Ionic Devices, 2016, Springer International Publishing, (ISBN: 978-3-319-39531-9)

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Contact Details

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15)
Hallenweg 23
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Science and Technology
Carré
P.O. Box 217
7500 AE Enschede
The Netherlands

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