dr.ir. U. Celano PhD (Umberto)

Assistant Professor

About Me

Umberto Celano is a trained electrical engineer from the University of Rome Sapienza, Italy. After a master’s in nanoelectronics, he joined imec (Belgium) for his PhD in the laboratory of Wilfried Vandervorst (2010) where he got interested in condensed matter physics and materials analysis for semiconductor technology. During this period, he learned multiple analytical techniques and focused on scanning probe microscopies, working to establish a novel three-dimensional nanoscale imaging technique to study materials in confined volumes (this work got him the 2013 IEDM Roger Haken Award). He received his Ph.D. in Physics from the University of Leuven - KU Leuven (Belgium) in 2015.

From 2016, he joined the Materials and Components Analysis (MCA) department at imec as a permanent researcher. Here, he contributed to various characterization projects and reliability studies, while applying the concept of tomographic scanning probe microscopies to a multitude of emerging devices. In 2018, he was a visiting scientist with the Geballe Laboratory for Advanced Materials at Stanford University where he expanded his research interest to functional materials in the realm of nanophotonic. Presently, he is a Principal Member of Technical Staff with imec and Asst. Professor at the University of Twente, his work remains focused on nanoelectronics with emphasis on the characterization of new materials, device physics, failure analysis, and correlative materials analysis. 



Oct. 2020 – Present (part-time) 

  • Asst. Professor at the Faculty of Science and Technology and MESA+ Institute for Nanotechnology– University of Twente

May 2019 – Present

  • Principal Member of Technical Staff, Interuniversitair Micro-Electronica Centrum (imec) – Leuven, Belgium

May 2018 – May 2019

  • Visiting Scientist - Stanford University, the Geballe Laboratory for Advanced Materials

Jan 2016 – Jan 2018

  • Research Scientist - Interuniversitair Micro-Electronica Centrum (imec) – Leuven, Belgium

June 2011 – Dec 2015

  • Ph.D. in Physics – KU Leuven, Dept. of Physics and Astronomy (Leuven, Belgium) Dissertation: “Metrology and Physical Mechanisms in New Generation Ionic Devices”



  • AVS executive committee member for the “Nanoscale Science and Technology Division” (2019 – present)
  • Member of the IEEE International Roadmap for Devices and Systems (IRDS) (2014 – present)
  • SEMI standards committee member for doping in advanced CMOS technology (2018-2019)
  • Member of Nano Letters young career editorial board (2015 – 2019)



  • PhD dissertation selected for the Springer Theses books collection (2016)
  • Honorable mention for PhD Thesis from KU Leuven - Science@Leuven (2016)
  • Best Paper at INC10 – NIST Gaithersburg, MD (2014)       
  • imec PhD Excellence award – 3 winners on 250 imec PhDs (2014)
  • Roger A. Haken Award at the International Electron Devices Meeting IEDM 2013


Other Contributions

SELECTED KEY PUBLICATIONS (in reverse chronological order): 

Van de Groep, J., Song, J., Celano, U., Kik, P., Brongersma, M., Exciton Resonance Tuning of an Atomically-thin Lens, Nature Photonics, 2020, 14, 426–430

Brown, K. A., Brittman, S., Maccaferri, N., Jariwala, D., Celano U., Machine Learning in Nanoscience: Big Data at Small Scales, Nano Letters, 2020, 20, 1, 2

N. G. Orji, M. Badaroglu, B. M. Barnes, C. Beitia, B. D. Bunday, U. Celano, R. J. Kline, M. Neisser, Y. Obeng, A. E. Vladar, Metrology for the next generation of semiconductor devices, Nature Electronics, 2018, 1, 532–547

Celano, U., Nagashima, K., Koga, H., Nogi, M., Suganuma, M., Zhuge, F., Meng, G., He, Y., Fantini, A., De Boeck, J., Jurczak, M., Vandervorst, W., Yanagida, T., All Nanocellulose Nonvolatile Resistive Memory, NPG Asia Materials,  2016, 8

Celano, U., Goux, L., Degraeve, R., Richard, O., Bender, H., Jurczak, M., Vandervorst, W., Imaging in the three-dimension the conductive channel in filamentary-based oxide resistive switching memory, Nano Letters, 2015, 15(12), 7970

Celano, U., Hantschel, T., Giammaria, G., Chintala, R., Conard, T., Bender, H., Vandervorst, W. Evaluation of the electrical contact area in contact-mode scanning probe microscopy, Journal of Applied Physics, 2015, 117, 214305

Celano, U., Goux, L., Belmonte, A., Opsomer, K., Franquet, A., Schulze, A., Detavernier, C., Richard, O., Bender, H., Jurczak, M., Vandervorst, W., Three-dimensional observation of the conductive filament in nanoscaled resistive memory devices, Nano Letters, 2014, 14, 2401


Electrical Atomic Force Microscopy for Nanoelectronics, 2019, Springer International Publishing, (ISBN: 978-3-030-15612-1)

Metrology and Physical Mechanisms in New Generation Ionic Devices, 2016, Springer International Publishing, (ISBN: 978-3-319-39531-9)

Google Scholar Link

Contact Details

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15)
Hallenweg 23
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Science and Technology
P.O. Box 217
7500 AE Enschede
The Netherlands

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