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A. Shafikov (Airat)

Researcher

About Me

I joined XUV Optics in 2017 as a PhD student and in 2022 I defended my thesis on the topic "Fracture behavior and characterization of free-standing metal silicide thin films". After obtaining PhD, I stayed at XUV as a postdoc to study interaction of surfaces with plasma under supervision of Marcelo Ackermann and Marko Sturm.

Expertise

Chemistry
Fracture Strength
Engineering & Materials Science
Fracture Toughness
Membranes
Silicides
Thin Films
Physics & Astronomy
Fracture Strength
Membranes
Thin Films

Publications

Recent
Shafikov, A. (2022). Fracture behavior and characterization of free-standing metal silicide thin films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036554251
Shafikov, A. , Schurink, B. , van de Kruijs, R. W. E. , & Bijkerk, F. (2019). Improving strength of LPCDV Si3N4 freestanding thin films by nanometer thick compressive adlayer. Poster session presented at Nanomechanical testing in materials research and development VII 2019, Malaga, Spain.

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15), room C2029
Hallenweg 21
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Science and Technology
Carré  C2029
P.O. Box 217
7500 AE Enschede
The Netherlands