About Me
I joined XUV Optics in 2017 as a PhD student and in 2022 I defended my thesis on the topic "Fracture behavior and characterization of free-standing metal silicide thin films". After obtaining PhD, I stayed at XUV as a postdoc to study interaction of surfaces with plasma under supervision of Marcelo Ackermann and Marko Sturm.
Expertise
Chemistry
# Fracture Strength
Engineering & Materials Science
# Fracture Toughness
# Membranes
# Silicides
# Thin Films
Physics & Astronomy
# Fracture Strength
# Membranes
# Thin Films
Organisations
Publications
Recent
Shafikov, A. (2022).
Fracture behavior and characterization of free-standing metal silicide thin films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente.
https://doi.org/10.3990/1.9789036554251
Shafikov, A.
, van de Kruijs, R. W. E.
, Benschop, J. P. H.
, Schurink, B.
, van den Beld, W. T. E.
, Houweling, Z. S.
, Kooi, B. J.
, Ahmadi, M., de Graaf, S.
, & Bijkerk, F. (2022).
Relation between composition and fracture strength in off-stoichiometric metal silicide free-standing membranes.
Intermetallics,
144, Article 107531.
https://doi.org/10.1016/j.intermet.2022.107531
Shafikov, A.
, van de Kruijs, R. W. E.
, Benschop, J. P. H.
, van den Beld, W.
, Houweling, S.
, & Bijkerk, F. (2022).
Fracture Toughness of Free-Standing ZrSiₓ Thin Films Measured Using Crack-on-a-Chip Method.
Journal of microelectromechanical systems,
31(1), 63-73.
https://doi.org/10.1109/JMEMS.2021.3128760
Shafikov, A.
, Schurink, B.
, van de Kruijs, R. W. E.
, Benschop, J. P. H.
, van den Beld, W.
, Houweling, S.
, & Bijkerk, F. (2021).
Strengthening ultrathin Si3N4 membranes by compressive surface stress.
Sensors and Actuators A: Physical,
317, Article 112456.
https://doi.org/10.1016/j.sna.2020.112456
Shafikov, A.
, van de Kruijs, R. W. E.
, Schurink, B.
, Benschop, J. P. H.
, & Bijkerk, F. (2020).
Mechanical properties of polycrystalline metal silicide thin films. Poster session presented at Physics@Veldhoven 2020, veldhoven, Netherlands.
Shafikov, A.
, Bijkerk, F.
, Schurink, B.
, Sturm, M.
, & van de Kruijs, R. W. E. (2020).
Pellicle for EUV lithograpy. (Patent No.
NL2025186).
Shafikov, A.
, Schurink, B.
, van de Kruijs, R. W. E.
, & Bijkerk, F. (2019).
Improving strength of LPCDV Si3N4 freestanding thin films by nanometer thick compressive adlayer. Poster session presented at Nanomechanical testing in materials research and development VII 2019, Malaga, Spain.
UT Research Information System
Contact Details
Visiting Address
University of Twente
Faculty of Science and Technology
Carré
(building no. 15), room C2029
Hallenweg 21
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Science and Technology
Carré
C2029
P.O. Box 217
7500 AE Enschede
The Netherlands