I have been a PhD student in the XUV group since 2021.
My research focuses on thin film interfaces. Specifically, I am trying to develop a method to study buried interfaces by Low Energy Ion Scattering.
Organisations
Publications
2024
Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis, Article 160615 (E-pub ahead of print/First online). Valpreda, A., Sturm, J. M., Yakshin, A. E., Woitok, J. F., Lokhorst, H. W., Phadke, P. & Ackermann, M.https://doi.org/10.1016/j.apsusc.2024.160615The effect of W thickness on the interface Si-on-W, a Low-Energy Ion Scattering study. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.
2023
Resolving buried interfaces by Low-Energy Ion Scattering. Valpreda, A.Resolving buried interfaces with low energy ion scattering, Article 043203. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1116/6.0002567
2022
Simulation of LEIS spectra: use of a Monte Carlo code to calculate reionization. Valpreda, A., Zameshin, A., Sturm, J. M., Yakshin, A. & Ackermann, M.
Research profiles
Courses academic year 2022/2023
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
Address
University of Twente
Carré (building no. 15), room 2.013
Hallenweg 23
7522 NH Enschede
Netherlands
University of Twente
Carré 2.013
P.O. Box 217
7500 AE Enschede
Netherlands
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