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Reflectance
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Recent
Krause, B., Kuznetsov, D. S., Yakshin, A. E., Ibrahimkutty, S., Baumbach, T., & Bijkerk, F. (2018). In situ and real-time monitoring of structure formation during non-reactive sputter deposition of lanthanum and reactive sputter deposition of lanthanum nitride. Journal of applied crystallography, 51, 1013-1020. DOI: 10.1107/S1600576718007367
Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H., & Bijkerk, F. (2018). Double matrix effect in Low Energy Ion Scattering from La surfaces. Applied surface science, 440, 570-579. DOI: 10.1016/j.apsusc.2018.01.174
Sturm, J. M., Coloma Ribera, R., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2017). In vacuo low-energy ions scattering studies of ZrO2 growth by magnetron sputtering. In In vacuo low-energy ions scattering studies of ZrO2 growth by magnetron sputtering
Kuznetsov, D. S., Yakshin, A. E., Sturm, J. M., & Bijkerk, F. (2017). Thermal stability of high-reflectance La/B-based multilayers for 6.x nm wavelength. Journal of applied physics, 122(12), [125302]. DOI: 10.1063/1.5004128
Coloma Ribera, R., van de Kruijs, R. W. E., Sturm, J. M., Yakshin, A., & Bijkerk, F. (2017). Intermixing and thermal oxidation of ZrO2 thin films grown on a-Si, SiN, and SiO2 by metallic and oxidic mode magnetron sputtering. Journal of applied physics, 121(11), [115303]. DOI: 10.1063/1.4978367
Huang, Q., Medvedev, V., van de Kruijs, R. W. E., Yakshin, A., Louis, E., & Bijkerk, F. (2017). Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics. Applied physics reviews, 4(1), [011104]. DOI: 10.1063/1.4978290
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University of Twente
Faculty of Science and Technology
Carré
C2019
P.O. Box 217
7500 AE Enschede
The Netherlands