Expertise
Material Science
- Reflectivity
- Surface
- Temperature
- Thin Films
Chemistry
- Liquid Film
Physics
- Mirrors
- Growth
- Diffusivity
Organisations
Publications
2024
Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis (2024)Applied surface science, 670. Article 160615. Valpreda, A., Sturm, J. M., Yakshin, A. E., Woitok, J. F., Lokhorst, H. W., Phadke, P. & Ackermann, M.https://doi.org/10.1016/j.apsusc.2024.160615Publisher's Note: "Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers" (vol 134, 155301, 2023) (2024)Journal of Applied Physics, 135(14). Article 149901. Ijpes, D., Yakshin, A. E., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0209743The effect of W thickness on the interface Si-on-W, a Low-Energy Ion Scattering study (2024)[Contribution to conference › Poster] NWO Physics 2024. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.
2023
Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing (2023)Journal of Applied Physics, 134(24). Article 245303. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0175793Interface engineered ultrashort period soft X-ray multilayers: Growth, characterization, and optical response (2023)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. IJpes, D.https://doi.org/10.3990/1.9789036559270Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers (2023)Journal of Applied Physics, 134(15). Article 155301. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0168377Resolving buried interfaces with low energy ion scattering (2023)Journal of vacuum science & technology A: vacuum, surfaces, and films, 41(4). Article 043203. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1116/6.0002567Implementing 0.1 nm B4C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance (2023)Journal of Applied Physics, 133(24). Article 245301. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0153322Increasing soft x-ray reflectance of short-period W/Si multilayers using B4C diffusion barriers (2023)Journal of Applied Physics, 133(2). Article 025302. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0130677
2022
Influence of the Template Layer on the Structure and Ferroelectric Properties of PbZr<sub>0.52</sub>Ti<sub>0.48</sub>O<sub>3</sub> Films (2022)ACS Omega, 7(26), 22210-22220. Lucke, P., Nematollahi, M., Bayraktar, M., Yakshin, A. E., Elshof, J. E. t. & Bijkerk, F.https://doi.org/10.1021/acsomega.2c00815
Research profiles
Courses academic year 2024/2025
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
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