Expertise
Material Science
- Reflectivity
- Surface
- Temperature
- Thin Films
Chemistry
- Liquid Film
Physics
- Mirrors
- Growth
- Diffusivity
Organisations
Publications
2025
Unveiling the effect of adding B4C at the W-on-Si interface (2025)Surfaces and Interfaces, 72. Article 107471. Valpreda, A., Lokhorst, H. W., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1016/j.surfin.2025.107471Resolving the W-on-Si interface by non-destructive low energy ion scattering (2025)Surfaces and Interfaces, 70. Article 106879. Valpreda, A., Christenhusz, M., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1016/j.surfin.2025.106879Diving into thin-film interfaces using low energy ion scattering (2025)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Valpreda, A.https://doi.org/10.3990/1.9789036565844Calcium Niobate nanosheets: a 2D model system for investigating LEIS surface and tail signals (2025)[Contribution to conference › Poster] LEIS Workshop 2025. Valpreda, A., Sturm, J. M., Yakshin, A. & Ackermann, M.
2024
High reflectance ultrashort period W/B4C x-ray multilayers via intermittent ion polishing (2024)Journal of Applied Physics, 136(24). Article 245302. IJpes, D., Yakshin, A. E. & Ackermann, M. D.https://doi.org/10.1063/5.0230745Resolving the W-on-Si interface by non-destructive low energy ion scattering (2024)[Working paper › Preprint]. Valpreda, A., Christenhusz, M., Sturm, J. M., Yakshin, A. E. & Ackermann, M.Examining the influence of W thickness on the Si-on-W Interface: A comparative metrology analysis (2024)Applied surface science, 670. Article 160615. Valpreda, A., Sturm, J. M., Yakshin, A. E., Woitok, J. F., Lokhorst, H. W., Phadke, P. & Ackermann, M.https://doi.org/10.1016/j.apsusc.2024.160615Publisher's Note: "Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers" (vol 134, 155301, 2023) (2024)Journal of Applied Physics, 135(14). Article 149901. Ijpes, D., Yakshin, A. E., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0209743The effect of W thickness on the interface Si-on-W, a Low-Energy Ion Scattering study (2024)[Contribution to conference › Poster] NWO Physics 2024. Valpreda, A., Sturm, J. M., Yakshin, A. E. & Ackermann, M.
2023
Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing (2023)Journal of Applied Physics, 134(24). Article 245303. IJpes, D., Yakshin, A., Sturm, J. M. & Ackermann, M.https://doi.org/10.1063/5.0175793
Research profiles
Courses academic year 2025/2026
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
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