dr. A. Yakshin (Andrey)

Physics & Astronomy

# Ion Scattering
# Laminates
# Mirrors
# Reflectance
# Retarding
# Wavelengths

Engineering & Materials Science

# Multilayers

Chemistry

# Multilayer

Faculty of Science and Technology (TNW), XUV Optics (XUV)

Valpreda, A. , Zameshin, A. , Sturm, J. M. , Yakshin, A. , & Ackermann, M. (2022). Simulation of LEIS spectra: use of a Monte Carlo code to calculate reionization. Poster session presented at Physics@Veldhoven 2022, Veldhoven, Netherlands.

Lucke, P. , Bayraktar, M. , Yakshin, A. , Rijnders, A. J. H. M. , Bijkerk, F. , & Houwman, E. P. (2021). Describing hysteresis for non-switching fields in epitaxial monoclinic PZT films using polarization rotation model. Poster session presented at EMRS Fall Meeting 2021.

Lucke, P. , Bayraktar, M. , Yakshin, A. , Rijnders, A. J. H. M. , Bijkerk, F. , & Houwman, E. P. (2021). Describing Hysteresis for Non-Switching Fields in Epitaxial Monoclinic PZT Films Using Polarization Rotation Model. Poster session presented at MRS Fall Meeting 2021, Boston, Massachusetts, United States.

Lucke, P. , Polyakov, A. Y. , Bayraktar, M. , Schukkink, N. , Nematollahi, M. , Yakshin, A. , Rijnders, A. J. H. M. , & Bijkerk, F. (2021). Adaptive multilayer mirrors based on piezoelectric actuators. Poster session presented at Physics@Veldhoven 2021, Online Event, Netherlands.

Lucke, P. , Bayraktar, M. , Schukkink, N. , Yakshin, A. E. , Rijnders, G. , Bijkerk, F. , & Houwman, E. P. (2021). Influence of DC Bias on the Hysteresis, Loss, and Nonlinearity of Epitaxial PbZr_0.55 Ti_0.45 O₃ Films. Advanced electronic materials, 7(8), [2100115]. https://doi.org/10.1002/aelm.202100115

Medvedev, R. (2021). W-based multilayer soft X-ray Bragg optics: Synthesis and characterization. University of Twente. https://doi.org/10.3990/1.9789036551564

Lucke, P. (2021). Layer Growth And Hysteresis Modelling Of Epitaxial Lead Zirconate Titanate Thin films. University of Twente. https://doi.org/10.3990/1.9789036551526

Zameshin, A. A. , Medvedev, R. V. , Yakshin, A. E. , & Bijkerk, F. (2021). Interface formation in W/Si multilayers studied by Low Energy Ion Scattering. Thin solid films, 724, [138569]. https://doi.org/10.1016/j.tsf.2021.138569

Medvedev, R., Hendrikx, C. P. , Sturm, J. M., Yakunin, S. N. , Makhotkin, I. A. , Yakshin, A. , & Bijkerk, F. (2021). Post deposition nitridation of Si in W/Si soft x-ray multilayer systems. Thin solid films, 725, [138601]. https://doi.org/10.1016/j.tsf.2021.138601

Lucke, P. , Bayraktar, M. , Birkhölzer, Y. A. , Nematollahi, M. , Yakshin, A. , Rijnders, A. J. H. M. , Bijkerk, F. , & Houwman, E. P. (2020). Hysteresis, loss and nonlinearity in epitaxial PbZr_0.55Ti_0.45O₃ films: A polarization rotation model. Advanced functional materials, 30(52), [2005397]. https://doi.org/10.1002/adfm.202005397

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+31534894394

a.yakshin@utwente.nl

Visiting Address

University of Twente
Drienerlolaan 5
7522 NB Enschede
The Netherlands

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University of Twente
P.O. Box 217
7500 AE Enschede
The Netherlands

Faculty of Science and Technology (TNW), XUV Optics (XUV)

University of Twente Drienerlolaan 5
7522 NB Enschede

+31 (0)53 489 9111
info@utwente.nl
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Courses Academic Year 2021/2022

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