Welcome...

dr. C.G. Zeinstra (Chris)

Assistant Professor

Expertise

Engineering & Materials Science
Biometrics
Classifiers
Face Recognition
Image Resolution
Software Packages
Mathematics
Classifier
Physics & Astronomy
Confidence
Intervals

Publications

Recent
Bassit, A. , Hahn, F. , Zeinstra, C. , Veldhuis, R. , & Peter, A. (2021). Bloom Filter vs Homomorphic Encryption: Which approach protects the biometric data and satisfies ISO/IEC 24745? In BIOSIG 2021 - Proceedings of the 20th International Conference of the Biometrics Special Interest Group: 15.-17. September 2021 International Digital Conference IEEE. https://doi.org/10.1109/BIOSIG52210.2021.9548304
Zeinstra, C. , Meuwly, D. , Veldhuis, R. , & Spreeuwers, L. (2019). Mind the Gap: A practical framework for classifiers in a forensic context. In 2018 IEEE 9th International Conference on Biometrics Theory, Applications and Systems, BTAS 2018 [8698583] (IEEE nternational Conference on Biometrics Theory, Applications and Systems (BTAS); Vol. 2018). IEEE. https://doi.org/10.1109/BTAS.2018.8698583
Zeinstra, C. , & Haasnoot, E. (2018). Shallow CNNs for the Reliable Detection of Facial Marks. In A. Bromme, A. Uhl, C. Busch, C. Rathgeb, & A. Dantcheva (Eds.), 2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018 [8553157] (International Conference of the Biometrics Special Interest Group (BIOSIG); Vol. 2018). IEEE. https://doi.org/10.23919/BIOSIG.2018.8553157
Haasnoot, E., Khodabakhsh, A. , Zeinstra, C. , Spreeuwers, L. , & Veldhuis, R. (2018). FEERCI: A Package for Fast Non-Parametric Confidence Intervals for Equal Error Rates in Amortized O(m log n). In A. Bromme, A. Uhl, C. Busch, C. Rathgeb, & A. Dantcheva (Eds.), 2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018 [8553607] (International Conference of the Biometrics Special Interest Group (BIOSIG); Vol. 2018). IEEE. https://doi.org/10.23919/BIOSIG.2018.8553607
Zeinstra, C. , Veldhuis, R. , & Spreeuwers, L. (2017). How Random Is a Classifier Given Its Area under Curve? In A. Brömme, C. Busch, A. Dantcheva, C. Rathgeb, & A. Uhl (Eds.), 2017 International Conference of the Biometrics Special Interest Group (BIOSIG): BIOSIG 2017 [8053509] Gesellschaft für Informatik. https://doi.org/10.23919/BIOSIG.2017.8053509
Zeinstra, C. , Veldhuis, R. , Spreeuwers, L., & Ruifrok, A. (2017). Manually annotated characteristic descriptors: Measurability and variability. In 2017 5th International Workshop on Biometrics and Forensics (IWBF 2017) [7935095] IEEE. https://doi.org/10.1109/IWBF.2017.7935095

UT Research Information System

Courses Academic Year  2022/2023

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
 

Courses Academic Year  2021/2022

Contact Details

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling (building no. 11), room 4096
Hallenweg 19
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Zilverling  4096
P.O. Box 217
7500 AE Enschede
The Netherlands