Expertise

  • Physics

    • Electric Potential
    • Wafer
  • Material Science

    • Devices
    • Detector
    • Temperature
    • Hot Carrier
    • Metal
    • Switch

Organisations

Publications

2022

Recovery of hot-carrier degraded nMOSFETs (2022)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. de Jong, M. J.https://doi.org/10.3990/1.9789036553438

2020

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices (2020)In 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. Article 9129540 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE. De Jong, M. J., Salm, C. & Schmitz, J.https://doi.org/10.1109/IRPS45951.2020.9129540Analysis of short-circuit transients in the LHC main dipole circuit (2020)Journal of physics: Conference series, 1559(1). Article 012077. Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P.https://doi.org/10.1088/1742-6596/1559/1/012077

Research profiles

Courses academic year 2024/2025

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.

Courses academic year 2023/2024

Address

University of Twente

Carré (building no. 15), room C2611
Hallenweg 23
7522 NH Enschede
Netherlands

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