Expertise
Engineering & Materials Science
# Detectors
# Hot Carriers
# Imaging Techniques
# Photocathodes
# Photons
# Recovery
Physics & Astronomy
# Chips
# Detectors
Organisations
Publications
Recent
de Jong, M. J. (2022).
Recovery of hot-carrier degraded nMOSFETs. University of Twente.
https://doi.org/10.3990/1.9789036553438
De Jong, M. J.
, Salm, C.
, & Schmitz, J. (2020).
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. In
2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings [9129540] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE.
https://doi.org/10.1109/IRPS45951.2020.9129540
Liakopoulou, A.
, Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M.
, Ravaioli, E.
, Salm, C.
, Schmitz, J.
, & Verweij, A. P. (2020).
Analysis of short-circuit transients in the LHC main dipole circuit.
Journal of physics: Conference series,
1559(1), [012077].
https://doi.org/10.1088/1742-6596/1559/1/012077
Ozturk, E.
, Dikkers, M. J.
, Batenburg, K. M.
, Salm, C.
, & Schmitz, J. (2020).
RFID Tag Failure after Thermal Overstress. In
2019 IEEE International Integrated Reliability Workshop, IIRW 2019 [8989885] IEEE.
https://doi.org/10.1109/IIRW47491.2019.8989885
Liakopoulou, A.
, Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M.
, Ravaioli, E.
, Salm, C.
, Schmitz, J.
, & Verweij, A. P. (2019).
Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit. Abstract from 14th European Conference on Applied Superconductivity, EUCAS 2019, Glasgow, United Kingdom.
de Jong, M. J.
, Salm, C.
, & Schmitz, J. (2019).
Recovery after hot-carrier injection: Slow versus fast traps.
Microelectronics reliability,
100-101, [113318].
https://doi.org/10.1016/j.microrel.2019.06.010
de Jong, M. J.
, Salm, C.
, & Schmitz, J. (2018).
Towards understanding recovery of hot-carrier induced degradation.
Microelectronics reliability,
88-90, 147-151.
https://doi.org/10.1016/j.microrel.2018.07.057
de Jong, M. J.
, Salm, C.
, & Schmitz, J. (2017).
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs.
Microelectronics reliability,
76-77, 136-140.
https://doi.org/10.1016/j.microrel.2017.07.038
Wang, J.
, Houwman, E. P.
, Salm, C.
, Nguyen, D. M.
, Vergeer, K.
, & Schmitz, J. (2017).
Process induced poling and plasma induced damage of thin films PZT.
Microelectronic engineering,
177, 13-18.
https://doi.org/10.1016/j.mee.2017.01.016
UT Research Information System
Courses Academic Year 2022/2023
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
Courses Academic Year 2021/2022
Contact Details
Visiting Address
University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
(building no. 15), room C2611
Hallenweg 23
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré
C2611
P.O. Box 217
7500 AE Enschede
The Netherlands