Expertise
Physics & Astronomy
# Cyclotrons
# Degradation
# Energy
# Laminates
# Polishing
# Reflectance
# Roughness
# Tumors
Organisations
Publications
Recent
IJpes, D.
, Yakshin, A.
, Sturm, J. M., & Ackermann, M. (2023).
Increasing soft X-ray reflectance of short-period W/Si multilayers using B4C diffusion barriers.
Journal of Applied Physics,
133(2), [025302].
https://doi.org/10.1063/5.0130677
Medvedev, R. V.
, Nikolaev, K. V.
, Zameshin, A. A.
, Ijpes, D.
, Makhotkin, I. A., Yakunin, S. N.
, Yakshin, A. E.
, & Bijkerk, F. (2019).
Low-energy ion polishing of Si in W/Si soft X-ray multilayer structures.
Journal of Applied Physics,
126(4), [045302].
https://doi.org/10.1063/1.5097378
UT Research Information System
Contact Details
Visiting Address
University of Twente
Faculty of Science and Technology
Carré
(building no. 15)
Hallenweg 23
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Science and Technology
Carré
P.O. Box 217
7500 AE Enschede
The Netherlands