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Recent
Makhotkin, I. A., Sobierajski, R., Chalupsky, J., Tiedtke, K., de Vries, G., Störmer, M., ... Enkisch, H. (2018). Experimental study of EUV-mirror radiation damage resistance under long term FEL exposures below the single shot damage threshold. Journal of synchrotron radiation, 25(1), 77-84. DOI: 10.1107/S1600577517017362
Huang, Q., Yi, Q., Cao, Z., Qi, R., Loch, R. A., Jonnard, P., ... Wang, Z. (2017). High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region. Scientific reports, 7(1), [12929]. DOI: 10.1038/s41598-017-13222-5
Huang, Q., Medvedev, V., van de Kruijs, R. W. E., Yakshin, A., Louis, E., & Bijkerk, F. (2017). Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics. Applied physics reviews, 4(1), [011104]. DOI: 10.1063/1.4978290
Senf, F., Bijkerk, F., Eggenstein, F., Gwalt, G., Huang, Q., van de Kruijs, R. W. E., ... Erko, A. (2016). Highly efficient blazed grating with multilayer coating for tender X-ray energies. Optics express, 24(12), 13220-13230. DOI: 10.1364/OE.24.013220
Zoethout, E., Louis, E., & Bijkerk, F. (2016). In depth study of molybdenum silicon compound formation at buried interfaces. Journal of applied physics, 120(11), -. [115303]. DOI: 10.1063/1.4962541
Sobierajski, R., Jacyna, I., Dluzewski, P., Klepka, M., Klinger, D., Pelka, J. B., ... Chalupsky, J. (2016). Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 Mhz repetition rate. Optics express, 24(14), 15468-15477. DOI: 10.1364/OE.24.015468
Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. -. Poster session presented at Physics of X-Ray and Neutron Multilayer Structures workshop 2016, Enschede, Netherlands.
Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. -.
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University of Twente
Faculty of Science and Technology
Carré
2021
P.O. Box 217
7500 AE Enschede
The Netherlands