prof.dr. F. Bijkerk (Fred) | University of Twente

Multilayers

Mirrors

Wavelengths

Ions

Gratings

Optics

X Rays

Wavelength

Faculty of Science and Technology (TNW), XUV Optics (XUV)

Van Den Bos, R. A. J. M., Reinink, J., Lopaev, D. V., Lee, C. J., Benschop, J. P. H., & Bijkerk, F. (2018). Influence of internal stress and layer thickness on the formation of hydrogen induced thin film blisters in Mo/Si multilayers. Journal of physics D: applied physics, 51(11), [115302]. DOI: 10.1088/1361-6463/aaad86

Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H., & Bijkerk, F. (2018). Double matrix effect in Low Energy Ion Scattering from La surfaces. Applied surface science, 440, 570-579. DOI: 10.1016/j.apsusc.2018.01.174

Mund, B. K., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2018). Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light. Applied surface science, 427(Part B), 1033-1040. DOI: 10.1016/j.apsusc.2017.09.098

Nikolaev, K., Makhotkin, I. A., Yakunin, S. N., van de Kruijs, R. W. E., & Bijkerk, F. (2017). Crystal surface characterization.

Stilhano Vilas Boas, C. R., Sturm, J. M., & Bijkerk, F. (2017). Oxygen diffusion characterization by depth-resolved low energy ion spectroscopy.

Nikolaev, K., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., & Bijkerk, F. (2017). Advanced crystal surface characterization with asymmetrical X-ray diffraction.

Coloma Ribera, R., Sturm, J. M., van de Kruijs, R. W. E., Yakshin, A., & Bijkerk, F. (2017). In-vacuo growth studies and thermal oxidation of ZrO2 thin films.

van den Bos, R., Benschop, J., Bijkerk, F., & Lee, C. J. (2017). A model for hydrogen induced blister growth in Mo/Si multilayer mirror structures.

Medvedev, R., Yakshin, A., & Bijkerk, F. (2017). Small period multilayer structures for X-ray spectroscopic applications.

Kuznetsov, D., Yakshin, A., Sturm, J. M., van de Kruijs, R. W. E., Louis, E., & Bijkerk, F. (2017). Grazing-incidence La/B-based mirrors with “La surface nitridation” for 6.x nm wavelength.

201600261 - CS XUV

+31534894646 (secretary)

+31534892863 (if no answer)

f.bijkerk@utwente.nl

secretariaat-xuv-tnw@utwente.nl

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15), room 2025
Hallenweg 23
7522NH Enschede
The Netherlands

Navigate to location

Mailing Address

University of Twente
Faculty of Science and Technology
Carré 2025
P.O. Box 217
7500 AE Enschede
The Netherlands

Faculty of Science and Technology (TNW), XUV Optics (XUV)

University of Twente Drienerlolaan 5
7522 NB Enschede

+31 (0)53 489 9111
info@utwente.nl
Route