Prof.dr. Fred Bijkerk has a PhD in Experimental Physics from the University of Amsterdam (1993). His thesis describes the application of short-wavelength light from a laser-generated plasma source to X-ray and Extreme UV lithography. From 2004 to 2014 he was head of the Nanolayer Surface and Interface Physics department at the FOM-Institute for Plasma Physics Rijnhuizen. In 2005 he was appointed as a part-time professor on XUV sources and multilayer optics at the MESA+ Institute for Nanotechnology at the University of Twente.
Bijkerk received the FOM Valorization Prize 2010 for his efforts to engage high-tech industry in his research. In 2012 he initiated the Industrial Focus Group XUV Optics at MESA+, a public-privately funded research initiative on application-inspired thin film systems and XUV optics.
Bijkerk published over 250 journal articles and 35 patents on thin film systems and XUV optics and acted as the supervisor of 42 PhD doctorate candidates. He retired in 2021 to become part-time advisor on scientific and valorization aspects of the groupâs research, while Marcelo Ackermann took over his role as a full chair.
Expertise
Material Science
- Thin Films
- Surface
- Reflectivity
- Temperature
- Material
Physics
- Mirrors
- Optics
Chemistry
- Liquid Film
Organisations
Publications
Research profiles
Courses academic year 2023/2024
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
Courses academic year 2022/2023
Address
![](https://1348661504.rsc.cdn77.org/.uc/ia3848a2a0103e7e5110085e4f403ff94cdef11c068080801e3bc0268018041/carre.png)
University of Twente
Carré (building no. 15), room C2025
Hallenweg 23
7522 NH Enschede
Netherlands
University of Twente
Carré C2025
P.O. Box 217
7500 AE Enschede
Netherlands