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prof.dr. F. Bijkerk (Fred)

Full Professor and Programme Leader Industrial Focus Group XUV Optics

Expertise

Multilayers
Mirrors
Wavelengths
Reflectance
Ions
Gratings
Optics
Mirrors

Publications

Recent Articles
Nikolaev, K., Makhotkin, I. A., Yakunin, S. N., van de Kruijs, R. W. E., & Bijkerk, F. (2017). Crystal surface characterization. Poster session presented at ALTECH 2017, Berlin, Germany.
Nikolaev, K., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., & Bijkerk, F. (2017). Advanced crystal surface characterization with asymmetrical X-ray diffraction. Poster session presented at Physics Veldhoven, Veldhoven, Netherlands, .
Medvedev, R., Yakshin, A., & Bijkerk, F. (2017). Small period multilayer structures for X-ray spectroscopic applications. Poster session presented at Physics Veldhoven, Veldhoven, Netherlands, .

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15), room 2025
Hallenweg 23
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Science and Technology
Carré  2025
P.O. Box 217
7500 AE Enschede
The Netherlands