Expertise
Wavelengths
Reflectance
Mirrors
X Rays
Thin Films
Optics
Lithography
Ions
Organizations
Publications
Recent
Milov, I., Makhotkin, I. A., Sobierajski, R., Medvedev, N., lipp, V., Chalupsky, J., ... Bijkerk, F. (2018). Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. Optics express, 26(15), 19665-19685. DOI: 10.1364/OE.26.019665
Krause, B., Kuznetsov, D. S., Yakshin, A. E., Ibrahimkutty, S., Baumbach, T., & Bijkerk, F. (2018). In situ and real-time monitoring of structure formation during non-reactive sputter deposition of lanthanum and reactive sputter deposition of lanthanum nitride. Journal of applied crystallography, 51, 1013-1020. DOI: 10.1107/S1600576718007367
Stilhano Vilas Boas, C. R., Sturm, J. M., & Bijkerk, F. (2018). Isotopic labelling study of oxygen diffusion in oxide thin films by low energy ion scattering. Poster session presented at 14th International Conference on Diffusion in Solids and Liquids 2018, Amsterdam, Netherlands.
Mund, B. K., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2018). Formation of H2O on a CO2 dosed Ru(0 0 0 1) surface under Extreme Ultraviolet Light and H2. Applied surface science, 456, 538-544. DOI: 10.1016/j.apsusc.2018.06.166
Dolgov, A., Lee, C. J., Bijkerk, F., Abrikosov, A., Krivtsun, V. M., Lopaev, D., ... van Kampen, M. (2018). Plasma-assisted oxide removal from ruthenium-coated EUV optics. Journal of applied physics, 123(15), [153301]. DOI: 10.1063/1.5006771
Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J., & Bijkerk, F. (2018). Control of YH3 formation and stability via hydrogen surface adsorption and desorption. Applied surface science, 455, 70-74. DOI: 10.1016/j.apsusc.2018.05.134
Reinink, J., Van De Kruijs, R. W. E., & Bijkerk, F. (2018). Self-contained in-vacuum in situ thin film stress measurement tool. Review of scientific instruments, 89(5), [053904]. DOI: 10.1063/1.5021790
Stilhano Vilas Boas, C. R., Sturm, J. M., & Bijkerk, F. (2018). Oxygen diffusion characterization in ultrathin films by low energy ion scattering. Poster session presented at Physics@Veldhoven 2018, Veldhoven, Netherlands.
UT Research Information System
Courses
Contact Details
Visiting Address
University of Twente
Faculty of Science and Technology
Carré
(building no. 15), room C2025
Hallenweg 23
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Science and Technology
Carré
C2025
P.O. Box 217
7500 AE Enschede
The Netherlands