prof.dr. F. Bijkerk (Fred) | University of Twente

Multilayers

Mirrors

Wavelengths

Ions

Optics

Gratings

X Rays

Wavelength

Faculty of Science and Technology (TNW), XUV Optics (XUV)

Dolgov, A., Lee, C. J., Bijkerk, F., Abrikosov, A., Krivtsun, V. M., Lopaev, D., ... van Kampen, M. (2018). Plasma-assisted oxide removal from ruthenium-coated EUV optics. Journal of applied physics, 123(15), [153301]. DOI: 10.1063/1.5006771

Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H., & Bijkerk, F. (2018). Double matrix effect in Low Energy Ion Scattering from La surfaces. Applied surface science, 440, 570-579. DOI: 10.1016/j.apsusc.2018.01.174

Stilhano Vilas Boas, C. R., Sturm, J. M., & Bijkerk, F. (2018). Oxygen diffusion characterization in ultrathin films by low energy ion scattering. Poster session presented at Physics@Veldhoven 2018, Veldhoven, Netherlands.

Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J., & Bijkerk, F. (2018). Control of YH₃ formation and stability via hydrogen surface adsorption and desorption. Applied surface science, 455, 70-74. DOI: 10.1016/j.apsusc.2018.05.134

Reinink, J., Van De Kruijs, R. W. E., & Bijkerk, F. (2018). Self-contained in-vacuum in situ thin film stress measurement tool. Review of scientific instruments, 89(5), [053904]. DOI: 10.1063/1.5021790

Van Den Bos, R. A. J. M., Reinink, J., Lopaev, D. V., Lee, C. J., Benschop, J. P. H., & Bijkerk, F. (2018). Influence of internal stress and layer thickness on the formation of hydrogen induced thin film blisters in Mo/Si multilayers. Journal of physics D: applied physics, 51(11), [115302]. DOI: 10.1088/1361-6463/aaad86

Mund, B. K., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2018). Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light. Applied surface science, 427(Part B), 1033-1040. DOI: 10.1016/j.apsusc.2017.09.098

Stilhano Vilas Boas, C. R., Sturm, J. M., & Bijkerk, F. (2017). Oxygen diffusion characterization by depth-resolved low energy ion spectroscopy.

Medvedev, R., Yakshin, A., & Bijkerk, F. (2017). Small period multilayer structures for X-ray spectroscopic applications.

Kuznetsov, D., Yakshin, A., Sturm, J. M., van de Kruijs, R. W. E., Louis, E., & Bijkerk, F. (2017). Grazing-incidence La/B-based mirrors with “La surface nitridation” for 6.x nm wavelength.

201600261 - CS XUV

+31534894646 (secretary)

+31534892863 (if no answer)

f.bijkerk@utwente.nl

secretariaat-xuv-tnw@utwente.nl

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15), room 2025
Hallenweg 23
7522NH Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Science and Technology
Carré 2025
P.O. Box 217
7500 AE Enschede
The Netherlands

Faculty of Science and Technology (TNW), XUV Optics (XUV)

University of Twente Drienerlolaan 5
7522 NB Enschede

+31 (0)53 489 9111
info@utwente.nl
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