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prof.dr. F. Bijkerk (Fred)

Full Professor and Programme Leader Industrial Focus Group XUV Optics

Expertise

Multilayers
Wavelengths
Mirrors
Reflectance
Optics
Wavelength
Lithography
X Rays

Publications

Recent Articles
Huang, Q., Yi, Q., Cao, Z., Qi, R., Loch, R. A., Jonnard, P., ... Wang, Z. (2017). High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region. Scientific reports, 7(1), [12929]. DOI: 10.1038/s41598-017-13222-5
Huber, S., Gullikson, E., Meyer-Ilse, J., Frye, C. D., Edgar, J. H., van de Kruijs, R. W. E., ... Prendergast, D. (2017). Detection of defect populations in superconductor boron subphosphide B12P2 through X-ray absorption spectroscopy. Journal of materials chemistry. A, 5, 5737-5749. DOI: 10.1039/C6TA10935G
Liu, F., Sturm, J. M., Lee, C. J., & Bijkerk, F. (2017). Coexistence of ice clusters and liquid-like water clusters on the Ru(0001) surface. Physical chemistry chemical physics (PCCP), 19(12), 8288-8299. DOI: 10.1039/C6CP07369G

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15), room 2025
Hallenweg 23
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Science and Technology
Carré  2025
P.O. Box 217
7500 AE Enschede
The Netherlands