Expertise
Physics & Astronomy
# Lithography
# Mirrors
# Optics
# Reflectance
# Thin Films
# Wavelengths
Engineering & Materials Science
# Multilayers
Chemistry
# Multilayer
Organisations
Publications
Recent
Shafikov, A.
, van de Kruijs, R. W. E.
, Benschop, J. P. H.
, van den Beld, W.
, Houweling, S.
, & Bijkerk, F. (2022).
Fracture Toughness of Free-Standing ZrSiₓ Thin Films Measured Using Crack-on-a-Chip Method.
Journal of microelectromechanical systems,
31(1), 63-73.
https://doi.org/10.1109/JMEMS.2021.3128760
Shafikov, A.
, van de Kruijs, R. W. E.
, Benschop, J. P. H.
, Schurink, B.
, van den Beld, W. T. E.
, Houweling, Z. S.
, Kooi, B. J.
, Ahmadi, M., de Graaf, S.
, & Bijkerk, F. (2022).
Relation between composition and fracture strength in off-stoichiometric metal silicide free-standing membranes.
Intermetallics,
144, [107531].
https://doi.org/10.1016/j.intermet.2022.107531
Phadke, P.
, Zameshin, A. A.
, Sturm, J. M.
, van de Kruijs, R. W. E.
, & Bijkerk, F. (2022).
Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms,
520, 29-39.
https://doi.org/10.1016/j.nimb.2022.03.016
Kizir, S. (2022).
Nucleation, growth and hydrogen resistance of multi-layer graphene. University of Twente.
https://doi.org/10.3990/1.9789036552820
Shavikof, A.
, Bijkerk, F.
, Schurink, B.
, Sturm, J. M.
, & van de Kruijs, R. W. E. (2021).
PELLICLE FOR EUV LITHOGRAPHY. (Patent No.
CN113646697).
Lucke, P.
, Bayraktar, M.
, Schukkink, N.
, Yakshin, A. E.
, Rijnders, G.
, Bijkerk, F.
, & Houwman, E. P. (2021).
Influence of DC Bias on the Hysteresis, Loss, and Nonlinearity of Epitaxial PbZr0.55 Ti0.45 O3 Films.
Advanced electronic materials,
7(8), [2100115].
https://doi.org/10.1002/aelm.202100115
Akhmetov, F.
, Milov, I., Formisano, F., Janssen, S., Semin, S.
, Makhotkin, I. A., Kimel, A.
, Bijkerk, F.
, & Ackermann, M. D. (2021).
Photo-induced ultrafast processes leading to degradation of thin films. Poster session presented at Physics@Veldhoven 2021, Online Event, Netherlands.
UT Research Information System
Courses Academic Year 2021/2022
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
Courses Academic Year 2020/2021
Contact Details
Visiting Address
University of Twente
Faculty of Science and Technology
Carré
(building no. 15), room C2025
Hallenweg 23
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Science and Technology
Carré
C2025
P.O. Box 217
7500 AE Enschede
The Netherlands