Expertise
Engineering & Materials Science
# Cells
# Reflection High Energy Electron Diffraction
# Thin Films
Chemistry
# Reflection High Energy Electron Diffraction
Physics & Astronomy
# Expulsion
# High Energy Electrons
# Strip
# Thin Films
Organisations
Publications
Recent
Smink, A. E. M.
, Birkhölzer, Y. A., Van Dam, J.
, Roesthuis, F. J. G.
, Rijnders, G.
, Hilgenkamp, H.
, & Koster, G. (2020).
Mapping unit-cell thickness variations in thin films by post-deposition reflection high-energy electron diffraction.
Physical Review Materials ,
4(8), Article 083806.
https://doi.org/10.1103/PhysRevMaterials.4.083806
UT Research Information System
Contact Details
Visiting Address
University of Twente
Faculty of Science and Technology
Carré
(building no. 15), room C2065
Hallenweg 21
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Science and Technology
Carré
C2065
P.O. Box 217
7500 AE Enschede
The Netherlands