Expertise
Engineering & Materials Science
# Cyber Physical System
# Electric Delay Lines
# Hardware Security
# System-On-Chip
Business & Economics
# Data Fusion
# Dependability
# Front-End
# Machine Learning
Publications
Recent
Ali, G., Bagheriye, L., Manhaeve, H.
, & Kerkhoff, H. G. (2020).
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. In
IEEE Asian Test Symposium, ATS 2020 (IEEE Asian Test Symposium (ATS); Vol. 2020, No. 29). IEEE.
https://doi.org/10.1109/ATS49688.2020.9301509
Bagheriye, L.
, Ali, G.
, & Kerkhoff, H. G. (2020).
Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. In
IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020 (pp. 1-4). (IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS); Vol. 2020, No. 26). IEEE.
https://doi.org/10.1109/IOLTS50870.2020.9159753
Ali, G., Bagheriye, L.
, & Kerkhoff, H. G. (2020).
On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. In
IEEE International Symposium on Circuits and Systems, ISCAS 2020 (pp. 1-5). (IEEE International Symposium on Circuits and Systems (ISCAS); Vol. 2020). IEEE.
https://doi.org/10.1109/ISCAS45731.2020.9180773
Ali, G.
, Pathros, J.
, & Kerkhoff, H. G. (2019).
IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation. In
Proceedings - 2019 IEEE European Test Symposium, ETS 2019 (pp. 1-6). [8791539] (Proceedings of the European Test Workshop (ETS); Vol. 2019). IEEE.
https://doi.org/10.1109/ETS.2019.8791539
Ali, G.
, Pathrose Vareed, J.
, & Kerkhoff, H. G. (2019).
IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time. In
2019 IEEE Latin American Test Symposium (LATS) [8704570]
https://doi.org/10.1109/LATW.2019.8704570
Pathrose Vareed, J.
, Ali, G.
, & Kerkhoff, H. G. (2019).
Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments. In
2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) (pp. 370-373). [8605571] IEEE.
https://doi.org/10.1109/APCCAS.2018.8605571
Ali, G.
, Pathrose Vareed, J.
, & Kerkhoff, H. G. (2018).
On‐Chip Lifetime Prediction for Dependable Many‐Processor SoCs based on Data Fusion. In
2018 IEEE 12th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC) (pp. 44-51)
https://doi.org/10.1109/MCSoC2018.2018.00019
Ali, G., Ebrahimi, H.
, Pathrose Vareed, J.
, & Kerkhoff, H. G. (2018).
Design and Implementation of a Dependable CPSoC for Automotive Applications. In
2018 IEEE Industrial Cyber-Physical Systems (ICPS) (pp. 246-251)
https://doi.org/10.1109/ICPHYS.2018.8387667
Pathrose Vareed, J.
, Ali, G.
, & Kerkhoff, H. G. (2018).
IJTAG compatible analogue embedded instruments for MPSoC life-time prediction. In
2018 IEEE 19th Latin-American Test Symposium (LATS) (pp. 1-4)
https://doi.org/10.1109/LATW.2018.8349691
Contact Details
Visiting Address
University of Twente
Drienerlolaan 5
7522 NB Enschede
The Netherlands
Mailing Address
University of Twente
P.O. Box 217
7500 AE Enschede
The Netherlands