Niek Lokhorst is a PhD student in the Industrial Focus Group XUV Optics (TNW faculty) with strong affiliations to the group Mathematics of Computational Science (MACS) (EEMCS faculty) at the University of Twente.
His research interests include x-ray metrology and Bayesian inference.
Expertise
Material Science
- Film
- Thin Films
- Amorphous Silicon
- Nanostructure
- Reflectivity
Physics
- Nanomaterial
- Silicon Films
- X-Ray Reflectivity
Organisations
Publications
2026
Using Monte Carlo-based Uncertainty Quantification for Free-Form XRR (2026)[Contribution to conference › Poster] NWO Physics 2026. Lokhorst, H. W., van de Kruijs, R. W. E., Makhotkin, I. A., Schlottbom, M. & Ackermann, M.
2025
Beyond the bulk: probing the EUV optical constants of nanoscale amorphous silicon films (2025)Optics express, 33(25), 52978-52989. Naghdi, S., Woitok, J., Tiwari, A., Lokhorst, H. W., Soltwisch, V. & Makhotkin, I.https://doi.org/10.1364/OE.578082Using Monte Carlo-based Uncertainty Quantification for Free-Form XRR (2025)[Contribution to conference › Poster] 8th PTB-Seminar on VUV and EUV Metrology 2025. Lokhorst, H. W., van de Kruijs, R. W. E., Makhotkin, I. A., Schlottbom, M. & Ackermann, M.Unveiling the effect of adding B4C at the W-on-Si interface (2025)Surfaces and Interfaces, 72. Article 107471. Valpreda, A., Lokhorst, H. W., Sturm, J. M., Yakshin, A. E. & Ackermann, M.https://doi.org/10.1016/j.surfin.2025.107471Using Monte Carlo-based methods for Uncertainty Quantification for XRR (2025)[Contribution to conference › Poster] International Workshop on X-Ray and Neutron Multilayer Structures, PXRNMS 2025. Lokhorst, H. W., van de Kruijs, R. W. E., Makhotkin, I. A., Schlottbom, M. & Ackermann, M.Instrumentation and uncertainty evaluation for absolute characterization of thin films and nanostructured surfaces in advanced optical metrology (2025)Metrologia, 62(2). Article 025010. Hansen, P.-E., Siaudinyte, L., Heidenreich, S., Soltwisch, V., Lokhorst, H. W., Tiwari, A., Makhotkin, I., Mattila, A., Lassila, A., Glabisch, S., Schröder, S., Brose, S., Nolot, E., Siefke, T., Asar, M., Memis, S., Yíldíz, F., Schiek, M. & Rømer, A. T.https://doi.org/10.1088/1681-7575/adbbf3
Research profiles
Courses academic year 2025/2026
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
Courses academic year 2024/2025
Address
University of Twente
Carré (building no. 15), room C2015
Hallenweg 23
7522 NH Enschede
Netherlands
University of Twente
Carré C2015
P.O. Box 217
7500 AE Enschede
Netherlands
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