Niek Lokhorst is a PhD student in the Industrial Focus Group XUV Optics (TNW faculty) with strong affiliations to the group Mathematics of Computational Science (MACS) (EEMCS faculty) at the University of Twente.

His research interests include x-ray metrology and Bayesian inference.

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University of Twente

Carré (building no. 15), room C2015
Hallenweg 23
7522 NH Enschede
Netherlands

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