Expertise
Material Science
- Reflectivity
- Characterization
- Laser
- Thin Films
Physics
- X Ray
- Grazing Incidence
Chemistry
- X-Ray
- Structure
Organisations
Publications
2024
Dewetting of Pt Nanoparticles Boosts Electrocatalytic Hydrogen Evolution Due to Electronic Metal-Support Interaction, Article 2403628 (E-pub ahead of print/First online). Harsha, S., Sharma, R. K., Dierner, M., Baeumer, C., Makhotkin, I., Mul, G., Ghigna, P., Spiecker, E., Will, J. & Altomare, M.https://doi.org/10.1002/adfm.202403628Electron and lattice response to ultrafast laser excitation: Exploring temperature dynamics in transition metals. University of Twente. Akhmetov, F.https://doi.org/10.3990/1.9789036561297The interface study of photoresist/underlayer using hybrid x-ray reflectivity and x-ray standing wave approach, 8-11. Tiwari, A., Fallica, R., Ackermann, M. & Makhotkin, I. A.X-ray standing wave characterization of the strong metal–support interaction in Co/TiOx model catalysts, 481 - 491. Tiwari, A., Monai, M., Matveevskii, K., Yakunin, S. N., Mandemaker, L. D. B., Tsvetanova, M., Goodwin, M. J., Ackermann, M. & Makhotkin, I. A.https://doi.org/10.1107/S1600576724001730
2023
Electron-phonon coupling in transition metals beyond Wang's approximation, Article 214301. Akhmetov, F., Milov, I., Makhotkin, I. A., Ackermann, M. & Vorberger, J.https://doi.org/10.1103/PhysRevB.108.214301Laser-induced electron dynamics and surface modification in ruthenium thin films, Article 112045. Akhmetov, F., Milov, I., Semin, S., Formisano, F., Medvedev, N., Sturm, J. M., Zhakhovsky, V. V., Makhotkin, I. A., Kimel, A. & Ackermann, M.https://doi.org/10.1016/j.vacuum.2023.112045Actinic Inspection of the EUV Optical Parameters of Lithographic Materials with Lab-Based Radiometry and ReflectometryIn Optical and EUV Nanolithography XXXVI, Article 1249407. SPIE. Dorney, K. M., Kissoon, N. N., Holzmeier, F., Larsen, E. W., Singh, D. P., Arvind, S., Santra, S., Fallica, R., Makhotkin, I., Philipsen, V., De Gendt, S., Fleischmann, C., van der Heide, P. A. W. & Petersen, J. S.https://doi.org/10.1117/12.2658359Precise optical constant determination in the soft X-ray, EUV, and VUV spectral rangeIn Metrology, Inspection, and Process Control XXXVII, Article 124963B. SPIE. Abbasirad, N., Saadeh, Q., Ciesielski, R., Gottwald, A., Philippsen, V., Makhotkin, I., Sokolov, A., Kolbe, M., Scholze, F. & Soltwisch, V.https://doi.org/10.1117/12.2659369Si transfer and self-limiting chemisorption on Ru thin film surface in hydrogen radicals environment. Gaffarov, I., Sturm, J. M., Vlooswijk, A., de Heij, P., Ackermann, M. D. & Makhotkin, I. A.https://spie.org/optics-optoelectronics/presentation/Si-transfer-and-self-limiting-chemisorption-on-Ru-thin-film/12578-20Laser-induced heating and surface modifications in Ru thin films. Akhmetov, F., Milov, I., Semin, S., Medvedev, N., Formisano, F., Zhakhovsky, V. V., Kimel, A., Makhotkin, I. A. & Ackermann, M.
Research profiles
Courses academic year 2023/2024
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
- 193599010 - Internship
- 193599039 - Master Thesis: Physics Aspects
- 193599089 - Master Thesis: General Aspects
- 201700174 - Internship & Job Orientation Project NT
- 201700185 - Internship
- 201800344 - Master's Assignment: Physics Aspects
- 201800345 - Master's Assignment: General Aspects
- 201900288 - Internship AM/AP
- 202000716 - Bachelor Assignment
- 202300191 - X-ray Characterization for S&T