dr.ir. J.M. Sturm (Marko)

I studied Applied Physics at Eindhoven University of Technology in the Netherlands, after which I obtained my PhD at the University of Twente in 2006. After 2 years of post-doc at the Fritz Haber Institute of the Max Planck Society in Berlin (Germany), I joined the FOM Institute for Plasma Physics Rijnhuizen in Nieuwegein (the Netherlands). Since 2014, when the current XUV group moved from Nieuwegein to the University of Twente, I have been senior staff member in the XUV group.

Throughout my career I developed a strong background in surface analysis, thin film fabrication and surface chemistry studies.

Physics & Astronomy

# Ion Scattering
# Ruthenium
# Thin Films
# Transition Metals

Engineering & Materials Science

# Ions
# Thin Films
# Transition Metals

Chemistry

# Multilayer

My research focuses on the application of surface analysis techniques to (i) study thin film growth, with a focus on XUV optics applications and (ii) study interaction of plasma, ions and radicals with thin film surfaces.

Valpreda, A. , Sturm, J. M. , Yakshin, A. E. , & Ackermann, M. (2024). The effect of W thickness on the interface Si-on-W, a Low-Energy Ion Scattering study. Poster session presented at NWO Physics 2024, Veldhoven, Netherlands.

Oldenkotte, V. J. S. (2024). Dual Modulation Scanning Tunneling Microscopy: a Quest for Subnanometer Chemical Contrast on Thin Films. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036559416

Baskakov, A., Golsanamlou, Z. , van de Kruijs, R. W. E. , Bokdam, M. , Sturm, J. M. , & Ackermann, M. (2023). Infrared emissivity of thin films based on molybdenum silicides with silicon. Poster session presented at MESA+ Meeting 2023, Enschede, Netherlands.

IJpes, D. , Yakshin, A. , Sturm, J. M. , & Ackermann, M. (2023). Interface smoothing in short-period W/B4C multilayers using neon ion beam polishing. Journal of Applied Physics, 134(24), Article 245303. https://doi.org/10.1063/5.0175793

Prasad, N. P., Rohnke, M., Verheijen, M. A. , Sturm, J. M., Hofmann, J. P., Hensen, E. J. M., & Bieberle-Hütter, A. (2023). Role of Excess Bi on the Properties and Performance of BiFeO₃ Thin-Film Photocathodes. ACS Applied Energy Materials, 6(24), 12237−12248. https://doi.org/10.1021/acsaem.3c01926

Gaffarov, I. , Sturm, J. M., Vlooswijk, A., de Heij, P. , Ackermann, M. D. , & Makhotkin, I. A. (2023). Si transfer and self-limiting chemisorption on Ru thin film surface in hydrogen radicals environment. Poster session presented at SPIE Optics + Optoelectronics 2023, Prague, Czech Republic. https://spie.org/optics-optoelectronics/presentation/Si-transfer-and-self-limiting-chemisorption-on-Ru-thin-film/12578-20

IJpes, D. , Yakshin, A. , Sturm, J. M. , & Ackermann, M. (2023). Growth and optical performance of short-period W/Al and polished W/Si/Al/Si multilayers. Journal of Applied Physics, 134(15), Article 155301. https://doi.org/10.1063/5.0168377

Rehman, A. , Kruijs, R. W. E. V. D. , Beld, W. T. E. V. D. , Sturm, J. M. , & Ackermann, M. (2023). Chemical Interaction of Hydrogen Radicals (H*) with Transition Metal Nitrides. The Journal of physical chemistry C, 127(36), 17770-17780. https://doi.org/10.1021/acs.jpcc.3c04490

IJpes, D. , Yakshin, A. , Sturm, J. M. , & Ackermann, M. (2023). Implementing 0.1 nm B₄C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance. Journal of Applied Physics, 133(24), Article 245301. https://doi.org/10.1063/5.0153322

Valpreda, A. , Sturm, J. M. , Yakshin, A. E. , & Ackermann, M. (2023). Resolving buried interfaces with low energy ion scattering. Journal of vacuum science & technology A: vacuum, surfaces, and films, 41(4), Article 043203. https://doi.org/10.1116/6.0002567

See all research output of this employee

I am involved in following courses:

Optics practical of module 6 (BSc Applied Physics)

Surfaces and Thin Layers (MSc Applied Physics)

Nanolab practical (MSc Nanotechnology)

In our research group we usually have thesis assignments available for BSc and MSc students Applied Physics and MSc students Nanotechnology.

Bachelor

Applied Physics

Master

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.

+31534891185

+31534894646 (if no answer)

j.m.sturm@utwente.nl

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15), room C2019
Hallenweg 21
7522NH Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Science and Technology
Carré C2019
P.O. Box 217
7500 AE Enschede
The Netherlands

University of Twente Drienerlolaan 5
7522 NB Enschede

+31 (0)53 489 9111
info@utwente.nl
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