Expertise
Physics & Astronomy
# Ion Scattering
# Ruthenium
# Thin Films
# Transition Metals
Engineering & Materials Science
# Ions
# Thin Films
# Transition Metals
Chemistry
# Multilayer
Organisations
Research
My research focuses on the application of surface analysis techniques to (i) study thin film growth, with a focus on XUV optics applications and (ii) study interaction of plasma, ions and radicals with thin film surfaces.
Publications
Recent
IJpes, D.
, Yakshin, A.
, Sturm, J. M.
, & Ackermann, M. (2023).
Implementing 0.1 nm B4C barriers in ultrashort period 1.0 nm W/Si multilayers for increased soft x-ray reflectance.
Journal of Applied Physics,
133(24), [245301].
https://doi.org/10.1063/5.0153322
Valpreda, A.
, Sturm, J. M.
, Yakshin, A. E.
, & Ackermann, M. (2023).
Resolving buried interfaces with low energy ion scattering.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films,
41(4), [043203].
https://doi.org/10.1116/6.0002567
Akhmetov, F.
, Milov, I., Semin, S., Formisano, F., Medvedev, N.
, Sturm, J. M., Zhakhovsky, V. V.
, Makhotkin, I. A., Kimel, A.
, & Ackermann, M. (2023).
Laser-induced electron dynamics and surface modification in ruthenium thin films.
Vacuum,
212, [112045].
https://doi.org/10.1016/j.vacuum.2023.112045
Sturm, J. M., Lokhorst, H. W.
, Zameshin, A. A.
, & Ackermann, M. D. (2023).
Charge exchange between He+ ions and solid targets: The dependence on target electronic structure revisited.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms,
538, 47-57.
https://doi.org/10.1016/j.nimb.2023.02.029
IJpes, D.
, Yakshin, A.
, Sturm, J. M.
, & Ackermann, M. (2023).
Increasing soft X-ray reflectance of short-period W/Si multilayers using B4C diffusion barriers.
Journal of Applied Physics,
133(2), [025302].
https://doi.org/10.1063/5.0130677
Valpreda, A.
, Zameshin, A.
, Sturm, J. M.
, Yakshin, A.
, & Ackermann, M. (2022).
Simulation of LEIS spectra: use of a Monte Carlo code to calculate reionization. Poster session presented at Physics@Veldhoven 2022, Veldhoven, Netherlands.
Sturm, J. M.
, van de Kruijs, R. W. E.
, Phadke, P.
, & Ackermann, M. (2022).
LEIS analysis of thin Cu films on Ru: an unexpected result on sputter intermixing. Poster session presented at LEIS Workshop 2022, Brno.
Phadke, P.
, Zameshin, A. A.
, Sturm, J. M.
, van de Kruijs, R. W. E.
, & Bijkerk, F. (2022).
Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms,
520, 29-39.
https://doi.org/10.1016/j.nimb.2022.03.016
Shavikof, A.
, Bijkerk, F.
, Schurink, B.
, Sturm, J. M.
, & van de Kruijs, R. W. E. (2021).
PELLICLE FOR EUV LITHOGRAPHY. (Patent No.
CN113646697).
UT Research Information System
Education
I am involved in following courses:
Optics practical of module 6 (BSc Applied Physics)
Surfaces and Thin Layers (MSc Applied Physics, materials track)
Nanolab practical (MSc Nanotechnology)
In our research group we usually have thesis assignments available for BSc and MSc students Applied Physics and MSc students Nanotechnology.
Affiliated Study Programmes
Bachelor
Master
Courses Academic Year 2023/2024
Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
Courses Academic Year 2022/2023
Contact Details
Visiting Address
University of Twente
Faculty of Science and Technology
Carré
(building no. 15), room C2019
Hallenweg 23
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Science and Technology
Carré
C2019
P.O. Box 217
7500 AE Enschede
The Netherlands