Jurriaan Schmitz was born in Elst, The Netherlands in 1967. He received his M.Sc. (1990, with honors) and Ph.D. (1994) degrees in Experimental Physics at the University of Amsterdam on research carried out at the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on new detectors for tracking and energy measurement of high-energy particles, the so-called MSGC and Spaghetti Calorimeter detectors. In this period he proposed the Micro Trench Gas Counter, employing constant-field rather than radial-field gas amplification, and the DME/CO2 gas mixture for miniaturized gaseous detectors.

After his Ph.D. he joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He worked on CMOS transistors from the 0,25 µm to the 90-nm node, studying super-steep retrograde wells, halo (pocket) implants, shallow junctions, GeSi gates, gate depletion and gate-last fabrication. Later he concentrated on characterization and reliability of CMOS devices, and studied the measurement issues arising from excessive gate leakage. He proposed the RF-CV characterization technique. He patented several new transistor architectures as well as inventions related to embedded flash memories and CMOS-APS image sensors.

In 2002 he became full professor at the University of Twente as the successor of Prof. Hans Wallinga. He expanded his research interests to include above-IC technologies and light-from-silicon. With his coworkers and PhD students he worked on a variety of topics in the areas of microfabrication, characterization and reliability. He currently heads a research group of ~30 people, the group Integrated Devices and Systems. In recent years he has shifted his research and teaching focus towards the energy transition and photovoltaics.

He fulfilled several functions in international conferences including IEEE IEDM, ESSDERC, IEEE IRPS and IEEE ICMTS. Also he was Editor of IEEE Electron Device Letters in 2013-2017 and of MDPI Sensors in 2018-2022. He served as board member of the Dutch Physical Society (NNV), board member of SAFE, chairperson of the IEEE EDS chapter Benelux and he was a member of the Program Council of the Materials Innovation Institute (M2i) and PointOne.

Prof. Schmitz authored or co-authored over 240 journal and conference papers, 18 patents, and three book chapters.

Expertise

  • Material Science

    • Temperature
    • Devices
    • Tungsten
    • Metal
    • Electrical Resistivity
  • Physics

    • Electric Potential
    • Silicon
    • Wafer

Organisations

Jurriaan Schmitz was born in Elst, NL in 1967. He studied in Experimental Physics at the University of Amsterdam and the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on MSGC and Spaghetti Calorimeter. He proposed the Micro Trench Gas Counter; and the DME/CO2 gas mixture for miniaturized gaseous detectors. He joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He proposed the RF-CV characterization technique and patented several new transistor architectures.

In 2002 he became full professor at the University of Twente. He expanded his research interests to include above-IC technologies and light-from-silicon. He worked on a variety of topics such as energy harvesting microchips, radiation imaging detectors on CMOS, and RF-CMOS and RF-MEMS reliability.

In recent years he has shifted his research and teaching focus towards the energy transition and photovoltaics.

Publications

2024
2023
Fluid classification with integrated flow and pressure sensors using machine learning, Article 114762. Alveringh, D., Le, D. V., Groenesteijn, J., Schmitz, J. & Lötters, J. C.https://doi.org/10.1016/j.sna.2023.114762Characterisation of Photodiodes in 22 nm FDSOI at 850 nmIn ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (pp. 65-68). IEEE. Bakker, J. H. T., Oude Alink, M. S., Schmitz, J. & Nauta, B.https://doi.org/10.1109/ESSDERC59256.2023.10268483Thermal Resistivity of FFF Printed Carbon Black Doped PolymersIn 2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS). IEEE. Jonkers, H., Kosmas, D., Schmitz, J. & Krijnen, G.https://doi.org/10.1109/FLEPS57599.2023.10220388In-depth analysis of potential-induced degradation in a commercial CIGS PV module. Yilmaz, P., de Wild, J., Aninat, R., Weber, T., Vermang, B., Schmitz, J. & Theelen, M.https://doi.org/10.1002/pip.3670Corrigendum to “Inaccuracies in contact resistivity from the Cox–Strack method: A review” [Sol. Energy Mater. Sol. Cells 246 (2022) 111909], Article 112254. van Wijngaarden, B., Yang, J. & Schmitz, J.https://doi.org/10.1016/j.solmat.2023.112254The world of chips: How do you make chips? . Ackermann, M., Nauta, B. & Schmitz, J.https://www.utwente.nl/nl/sg/programma/2023/3/386762/de-wereld-van-chips?code=4abdccddPerformance and Degradation in Silicon PV Systems Under Outdoor Conditions in Relation to Reliability Aspects of Silicon PV Modules - Summary of Results of COST Action PEARL PVIn 2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023. IEEE. Lindig, S., Ascencio-Vásquez, J., Leloux, J., Moser, D., Aghaei, M., Fairbrother, A., Gok, A., Ahmad, S., Kazim, S., Lobato, K., Van Sark, W. J. G. H. M., Pearsall, N., Burduhos, B. G., Raghoebarsing, A., Oreski, G., Schmitz, J., Theelen, M., Yilmaz, P., Kettle, J. & Reinders, A. H. M. E.https://doi.org/10.1109/PVSC48320.2023.10359742
2022
Review of technology specific degradation in crystalline silicon, cadmium telluride, copper indium gallium selenide, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies, 1365-1392. Kettle, J., Aghaei, m., Ahmad, S., Fairbrother, A., Irvine, S., Jacobsson, J., Kazim, S., Kazukauskas, V., Lamb, D., Lobato, K., Mousdis, G. E. O. R. G. I. O. S., Oreski, G., Reinders, A., Schmitz, J., Yilmaz, P. & Theelen, M.https://doi.org/10.1002/pip.3577Inaccuracies in contact resistivity from the Cox–Strack method: A review, Article 111909, 1-8. van Wijngaarden, B., Yang, J. & Schmitz, J.https://doi.org/10.1016/j.solmat.2022.111909Post-mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation, 640-647. Yilmaz, P., Aninat, R., Cruz, G. O., Weber, T., Schmitz, J. & Theelen, M.https://doi.org/10.1002/pip.3538Review of degradation and failure phenomena in photovoltaic modules, Article 112160. Aghaei, M., Fairbrother, A., Gok, A., Kazim, S., Lobato, K., Oreski, G., Reinders, A., Schmitz, J., Theelen, M., Yilmaz, P. & Kettle, J.https://doi.org/10.1016/j.rser.2022.112160Potential induced degradation of CIGS PV systems: A literature review, Article 111819. Yilmaz, P., Schmitz, J. & Theelen, M.https://doi.org/10.1016/j.rser.2021.111819Recovery of hot-carrier degraded nMOSFETs. University of Twente. de Jong, M. J.https://doi.org/10.3990/1.9789036553438
2021
2020
Effect of Ambient on the Recovery of Hot-Carrier Degraded DevicesIn 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings, Article 9129540. IEEE. De Jong, M. J., Salm, C. & Schmitz, J.https://doi.org/10.1109/IRPS45951.2020.9129540Analysis of short-circuit transients in the LHC main dipole circuit, Article 012077. Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P.https://doi.org/10.1088/1742-6596/1559/1/012077Towards electrostatic doping approaches in ultra-thin body semiconductor materials and devices. University of Twente. Gupta, G.https://doi.org/10.3990/1.9789036550185Conduction and electric field effect in ultra-thin tungsten films, Article 9016070, 202-209. van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y.https://doi.org/10.1109/TSM.2020.2976886Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel MaterialIn 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS), Article 9107901. IEEE. Smink, A. E. M., de Jong, M. J., Hilgenkamp, H., Van Der Wiel, W. G. & Schmitz, J.https://doi.org/10.1109/ICMTS48187.2020.9107901On the Accuracy of the Cox-Strack Equation and Method for Contact Resistivity Determination, Article 9031713, 1757-1763. van Rijnbach, M., Hueting, R. J. E., Stodolny, M., Janssen, G., Melskens, J. & Schmitz, J.https://doi.org/10.1109/TED.2020.2974194RFID Tag Failure after Thermal OverstressIn 2019 IEEE International Integrated Reliability Workshop, IIRW 2019, Article 8989885. IEEE. Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J.https://doi.org/10.1109/IIRW47491.2019.8989885

Research profiles

For bachelor students, Schmitz teaches about the MOSFET in the electrical engineering program, about the Manhattan Project in the Honours program and about the Energy Transition in the minors.

For master students, he is the main teacher of the course Integrated Circuit Technology. He further teaches in the courses Solar Energy, Measurement Systems for Mechatronics, Technology, Fabrication of Nanostructures and Energy Conversion Systems.

Besides these, he supervises students for internships and BSc and MSc final projects.

Further, he is a member of the Honours Educational Quality Committee and of the UT-wide College van Beroep voor de Examens.

Affiliated study programs

Courses academic year 2023/2024

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.

Courses academic year 2022/2023

Scan the QR code or
Download vCard