Jurriaan Schmitz was born in Elst, The Netherlands in 1967. He received his M.Sc. (1990, with honors) and Ph.D. (1994) degrees in Experimental Physics at the University of Amsterdam on research carried out at the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on new detectors for tracking and energy measurement of high-energy particles, the so-called MSGC and Spaghetti Calorimeter detectors. In this period he proposed the Micro Trench Gas Counter, employing constant-field rather than radial-field gas amplification, and the DME/CO2 gas mixture for miniaturized gaseous detectors.

After his Ph.D. he joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He worked on CMOS transistors from the 0,25 µm to the 90-nm node, studying super-steep retrograde wells, halo (pocket) implants, shallow junctions, GeSi gates, gate depletion and gate-last fabrication. Later he concentrated on characterization and reliability of CMOS devices, and studied the measurement issues arising from excessive gate leakage. He proposed the RF-CV characterization technique. He patented several new transistor architectures as well as inventions related to embedded flash memories and CMOS-APS image sensors.

In 2002 he became full professor at the University of Twente as the successor of Prof. Hans Wallinga. He expanded his research interests to include above-IC technologies and light-from-silicon. With his coworkers and PhD students he worked on a variety of topics in the areas of microfabrication, characterization and reliability. He currently heads a research group of ~30 people, the group Integrated Devices and Systems. In recent years he has shifted his research and teaching focus towards the energy transition and photovoltaics.

He fulfilled several functions in international conferences including IEEE IEDM, ESSDERC, IEEE IRPS and IEEE ICMTS. Also he was Editor of IEEE Electron Device Letters in 2013-2017 and of MDPI Sensors in 2018-2022. He served as board member of the Dutch Physical Society (NNV), board member of SAFE, chairperson of the IEEE EDS chapter Benelux and he was a member of the Program Council of the Materials Innovation Institute (M2i) and PointOne.

Prof. Schmitz authored or co-authored over 240 journal and conference papers, 18 patents, and three book chapters.

Expertise

  • Material Science

    • Temperature
    • Devices
    • Tungsten
    • Metal
    • Electrical Resistivity
  • Physics

    • Electric Potential
    • Silicon
    • Wafer

Organisations

Jurriaan Schmitz was born in Elst, NL in 1967. He studied in Experimental Physics at the University of Amsterdam and the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on MSGC and Spaghetti Calorimeter. He proposed the Micro Trench Gas Counter; and the DME/CO2 gas mixture for miniaturized gaseous detectors. He joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He proposed the RF-CV characterization technique and patented several new transistor architectures.

In 2002 he became full professor at the University of Twente. He expanded his research interests to include above-IC technologies and light-from-silicon. He worked on a variety of topics such as energy harvesting microchips, radiation imaging detectors on CMOS, and RF-CMOS and RF-MEMS reliability.

In recent years he has shifted his research and teaching focus towards the energy transition and photovoltaics.

Publications

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2024

Advances in 2D Anemometry (2024)[Contribution to conference › Poster] IEEE SENSORS 2024. Hackett, T. L., Sanders, R. G. P., Choi, J. Y., Džemaili, N., Winnen, V., van den Berg, T. E., Alveringh, D. & Schmitz, J.Design Parameter Comparison for a Silicon-based Directional Low Drift Thermal Anemometer for Horticultural Applications (2024)[Contribution to conference › Abstract] 50th International Micro and Nano Engineering Conference, MNE 2024. Hackett, T., Sanders, R. G. P., Alveringh, D. & Schmitz, J.A Machine Learning Enhanced MEMS Thermal Anemometer for Detection of Flow, Angle of Attack, and Relative Humidity (2024)IEEE Sensors Letters, 8(7). Article 6008304. Hackett, T., Sanders, R. G. P., Schmitz, J., Alveringh, D., van den Berg, T. E. & Choi, J. Y.https://doi.org/10.1109/LSENS.2024.3418193Viewing stomata in action: Autonomous in planta imaging of individual stomatal movement links morphology and kinetics (2024)[Working paper › Preprint]. bioRxiv. Berg, T. E. v. d., Sanders, R. G. P., Kaiser, E. & Schmitz, J.https://doi.org/10.1101/2024.03.13.584774A Multi-Parameter measurement system for MEMS Anemometers for Data Collection with Machine Learning Outcomes (2024)[Contribution to conference › Poster] 5th Conference on MicroFluidic Handling Systems, MFHS 2024. Hackett, T. L., Sanders, R. G. P., van den Berg, T. E., Alveringh, D. & Schmitz, J.A Multi-Parameter Measurement System for MEMS Anemoters for Data Collection with Machine Learning Outcomes (2024)[Contribution to conference › Paper] 5th Conference on MicroFluidic Handling Systems, MFHS 2024. Hackett, T., Alveringh, D., Sanders, R. G. P., van den Berg, T. E. & Schmitz, J.

2023

Fluid classification with integrated flow and pressure sensors using machine learning (2023)Sensors and Actuators A: Physical, 363. Article 114762. Alveringh, D., Le, D. V., Groenesteijn, J., Schmitz, J. & Lötters, J. C.https://doi.org/10.1016/j.sna.2023.114762Characterisation of Photodiodes in 22 nm FDSOI at 850 nm (2023)In ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (pp. 65-68). IEEE. Bakker, J. H. T., Oude Alink, M. S., Schmitz, J. & Nauta, B.https://doi.org/10.1109/ESSDERC59256.2023.10268483Thermal Resistivity of FFF Printed Carbon Black Doped Polymers (2023)In 2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS). IEEE. Jonkers, H., Kosmas, D., Schmitz, J. & Krijnen, G.https://doi.org/10.1109/FLEPS57599.2023.10220388Corrigendum to “Inaccuracies in contact resistivity from the Cox–Strack method: A review” [Sol. Energy Mater. Sol. Cells 246 (2022) 111909] (2023)Solar Energy Materials and Solar Cells, 254. Article 112254. van Wijngaarden, B., Yang, J. & Schmitz, J.https://doi.org/10.1016/j.solmat.2023.112254In-depth analysis of potential-induced degradation in a commercial CIGS PV module (2023)Progress in Photovoltaics, 31(6). Yilmaz, P., de Wild, J., Aninat, R., Weber, T., Vermang, B., Schmitz, J. & Theelen, M.https://doi.org/10.1002/pip.3670The world of chips: How do you make chips? (2023)[Non-textual form › Digital or Visual Products]. Ackermann, M., Nauta, B. & Schmitz, J.https://www.utwente.nl/nl/sg/programma/2023/3/386762/de-wereld-van-chips?code=4abdccddPerformance and Degradation in Silicon PV Systems Under Outdoor Conditions in Relation to Reliability Aspects of Silicon PV Modules - Summary of Results of COST Action PEARL PV (2023)In 2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023. IEEE. Lindig, S., Ascencio-Vásquez, J., Leloux, J., Moser, D., Aghaei, M., Fairbrother, A., Gok, A., Ahmad, S., Kazim, S., Lobato, K., Van Sark, W. J. G. H. M., Pearsall, N., Burduhos, B. G., Raghoebarsing, A., Oreski, G., Schmitz, J., Theelen, M., Yilmaz, P., Kettle, J. & Reinders, A. H. M. E.https://doi.org/10.1109/PVSC48320.2023.10359742

2022

Review of technology specific degradation in crystalline silicon, cadmium telluride, copper indium gallium selenide, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies (2022)Progress in Photovoltaics, 30(12), 1365-1392. Kettle, J., Aghaei, m., Ahmad, S., Fairbrother, A., Irvine, S., Jacobsson, J., Kazim, S., Kazukauskas, V., Lamb, D., Lobato, K., Mousdis, G. E. O. R. G. I. O. S., Oreski, G., Reinders, A., Schmitz, J., Yilmaz, P. & Theelen, M.https://doi.org/10.1002/pip.3577Inaccuracies in contact resistivity from the Cox–Strack method: A review (2022)Solar Energy Materials and Solar Cells, 246, 1-8. Article 111909. van Wijngaarden, B., Yang, J. & Schmitz, J.https://doi.org/10.1016/j.solmat.2022.111909Post-mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation (2022)Progress in Photovoltaics, 30(6), 640-647. Yilmaz, P., Aninat, R., Cruz, G. O., Weber, T., Schmitz, J. & Theelen, M.https://doi.org/10.1002/pip.3538Review of degradation and failure phenomena in photovoltaic modules (2022)Renewable & sustainable energy reviews, 159. Article 112160. Aghaei, M., Fairbrother, A., Gok, A., Kazim, S., Lobato, K., Oreski, G., Reinders, A., Schmitz, J., Theelen, M., Yilmaz, P. & Kettle, J.https://doi.org/10.1016/j.rser.2022.112160Potential induced degradation of CIGS PV systems: A literature review (2022)Renewable & sustainable energy reviews, 154. Article 111819. Yilmaz, P., Schmitz, J. & Theelen, M.https://doi.org/10.1016/j.rser.2021.111819Recovery of hot-carrier degraded nMOSFETs (2022)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. de Jong, M. J.https://doi.org/10.3990/1.9789036553438

2021

Low temperature pure boron layer deposition for silicon diode and micromachining applications (2021)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Liu, X.https://doi.org/10.3990/1.9789036552547Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current (2021)IEEE Transactions on Electron Devices, 68(2), 497-502. Article 9305941. Vermeer, M. L., Hueting, R. J. E., Pirro, L., Hoentschel, J. & Schmitz, J.https://doi.org/10.1109/TED.2020.3043223

2020

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices (2020)In 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. Article 9129540 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE. De Jong, M. J., Salm, C. & Schmitz, J.https://doi.org/10.1109/IRPS45951.2020.9129540Analysis of short-circuit transients in the LHC main dipole circuit (2020)Journal of physics: Conference series, 1559(1). Article 012077. Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P.https://doi.org/10.1088/1742-6596/1559/1/012077Towards electrostatic doping approaches in ultra-thin body semiconductor materials and devices (2020)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Gupta, G.https://doi.org/10.3990/1.9789036550185Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material (2020)In 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Article 9107901 (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. Smink, A. E. M., de Jong, M. J., Hilgenkamp, H., Van Der Wiel, W. G. & Schmitz, J.https://doi.org/10.1109/ICMTS48187.2020.9107901

Research profiles

For bachelor students, Schmitz teaches about the MOSFET in the electrical engineering program, about the Manhattan Project in the Honours program and about the Energy Transition in the minors.

For master students, he is the main teacher of the course Integrated Circuit Technology. He further teaches in the courses Solar Energy, Measurement Systems for Mechatronics, Technology, Fabrication of Nanostructures and Energy Conversion Systems.

Besides these, he supervises students for internships and BSc and MSc final projects.

Further, he is a member of the Honours Educational Quality Committee and of the UT-wide College van Beroep voor de Examens.

Affiliated study programs

Courses academic year 2024/2025

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.

Courses academic year 2023/2024

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