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prof.dr. J. Schmitz (Jurriaan)

Full Professor

About Me

Jurriaan Schmitz was born in Elst, The Netherlands in 1967. He received his M.Sc. (1990, with honors) and Ph.D. (1994) degrees in Experimental Physics at the University of Amsterdam on research carried out at the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on new detectors for tracking and energy measurement of high-energy particles, the so-called MSGC and Spaghetti Calorimeter detectors. In this period he proposed the Micro Trench Gas Counter, employing constant-field rather than radial-field gas amplification, and the DME/CO2 gas mixture for miniaturized gaseous detectors.

After his Ph.D. he joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He worked on CMOS transistors from the 0,25 µm to the 90-nm node, studying super-steep retrograde wells, halo (pocket) implants, shallow junctions, GeSi gates, gate depletion and gate-last fabrication. Later he concentrated on characterization and reliability of CMOS devices, and studied the measurement issues arising from excessive gate leakage. He proposed the RF-CV characterization technique. He patented several new transistor architectures as well as inventions related to embedded flash memories and CMOS-APS image sensors.

In 2002 he became full professor at the University of Twente as the successor of Prof. Hans Wallinga. He expanded his research interests to include above-IC technologies and light-from-silicon. With his coworkers and PhD students he worked on a variety of topics in the areas of microfabrication, characterization and reliability. He currently heads a research group of ~30 people, the group Integrated Devices and Systems. In recent years he has shifted his research and teaching focus towards the energy transition and photovoltaics.

He fulfilled several functions in international conferences including IEEE IEDM, ESSDERC, IEEE IRPS and IEEE ICMTS. Also he was Editor of IEEE Electron Device Letters in 2013-2017 and of MDPI Sensors in 2018-2022. He served as board member of the Dutch Physical Society (NNV), board member of SAFE, chairperson of the IEEE EDS chapter Benelux and he was a member of the Program Council of the Materials Innovation Institute (M2i) and PointOne.

Prof. Schmitz authored or co-authored over 240 journal and conference papers, 18 patents, and three book chapters.

Expertise

Physics & Astronomy
# Chips
# Cmos
# Detectors
Engineering & Materials Science
# Atomic Layer Deposition
# Detectors
# Hot Carriers
# Silicon
# Tungsten

Organisations

Research

Jurriaan Schmitz was born in Elst, NL in 1967. He studied in Experimental Physics at the University of Amsterdam and the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on MSGC and Spaghetti Calorimeter. He proposed the Micro Trench Gas Counter; and the DME/CO2 gas mixture for miniaturized gaseous detectors. He joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He proposed the RF-CV characterization technique and patented several new transistor architectures.

In 2002 he became full professor at the University of Twente. He expanded his research interests to include above-IC technologies and light-from-silicon. He worked on a variety of topics such as energy harvesting microchips, radiation imaging detectors on CMOS, and RF-CMOS and RF-MEMS reliability.

In recent years he has shifted his research and teaching focus towards the energy transition and photovoltaics.

Publications

Recent
Hackett, T. , Alveringh, D. , Sanders, R. G. P., van den Berg, T. E. , & Schmitz, J. (2024). A Multi-Parameter Measurement System for MEMS Anemoters for Data Collection with Machine Learning Outcomes. 126-129. Paper presented at 5th Conference on MicroFluidic Handling Systems, MFHS 2024, Munich, Germany.
Lindig, S., Ascencio-Vásquez, J., Leloux, J., Moser, D., Aghaei, M., Fairbrother, A., Gok, A., Ahmad, S., Kazim, S., Lobato, K., Van Sark, W. J. G. H. M., Pearsall, N., Burduhos, B. G., Raghoebarsing, A., Oreski, G. , Schmitz, J., Theelen, M., Yilmaz, P., Kettle, J. , & Reinders, A. H. M. E. (2023). Performance and Degradation in Silicon PV Systems Under Outdoor Conditions in Relation to Reliability Aspects of Silicon PV Modules - Summary of Results of COST Action PEARL PV. In 2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023 IEEE. https://doi.org/10.1109/PVSC48320.2023.10359742
Bakker, J. H. T. , Oude Alink, M. S. , Schmitz, J. , & Nauta, B. (2023). Characterisation of Photodiodes in 22 nm FDSOI at 850 nm. In ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (pp. 65-68). IEEE. https://doi.org/10.1109/ESSDERC59256.2023.10268483
Jonkers, H. , Kosmas, D. , Schmitz, J. , & Krijnen, G. (2023). Thermal Resistivity of FFF Printed Carbon Black Doped Polymers. In 2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) IEEE. https://doi.org/10.1109/FLEPS57599.2023.10220388
Yilmaz, P., de Wild, J., Aninat, R., Weber, T., Vermang, B. , Schmitz, J., & Theelen, M. (2023). In-depth analysis of potential-induced degradation in a commercial CIGS PV module. Progress in Photovoltaics: Research and Applications. Advance online publication. https://doi.org/10.1002/pip.3670
van Wijngaarden, B., Yang, J. , & Schmitz, J. (2022). Inaccuracies in contact resistivity from the Cox–Strack method: A review. Solar Energy Materials and Solar Cells, 246, 1-8. Article 111909. https://doi.org/10.1016/j.solmat.2022.111909
Kettle, J., Aghaei, M., Ahmad, S., Fairbrother, A., Irvine, S., Jacobsson, J., Kazim, S., Kazukauskas, V., Lamb, D., Lobato, K., Mousdis, G. E. O. R. G. I. O. S., Oreski, G. , Reinders, A. , Schmitz, J., Yilmaz, P., & Theelen, M. (2022). Review of technology specific degradation in crystalline silicon, cadmium telluride, copper indium gallium selenide, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies. Progress in Photovoltaics: Research and Applications, 30(12), 1365-1392. https://doi.org/10.1002/pip.3577
de Jong, M. J. (2022). Recovery of hot-carrier degraded nMOSFETs. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036553438
Yilmaz, P., Aninat, R., Cruz, G. O., Weber, T. , Schmitz, J., & Theelen, M. (2022). Post-mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation. Progress in Photovoltaics: Research and Applications, 30(6), 640-647. https://doi.org/10.1002/pip.3538
Aghaei, M., Fairbrother, A., Gok, A., Kazim, S., Lobato, K., Oreski, G. , Reinders, A. , Schmitz, J., Theelen, M., Yilmaz, P., & Kettle, J. (2022). Review of degradation and failure phenomena in photovoltaic modules. Renewable and Sustainable Energy Reviews, 159, Article 112160. https://doi.org/10.1016/j.rser.2022.112160
Yilmaz, P. , Schmitz, J., & Theelen, M. (2022). Potential induced degradation of CIGS PV systems: A literature review. Renewable and Sustainable Energy Reviews, 154, Article 111819. https://doi.org/10.1016/j.rser.2021.111819
Liu, X. (2021). Low temperature pure boron layer deposition for silicon diode and micromachining applications. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036552547
Vermeer, M. L. , Hueting, R. J. E., Pirro, L., Hoentschel, J. , & Schmitz, J. (2021). Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current. IEEE Transactions on Electron Devices, 68(2), 497-502. Article 9305941. https://doi.org/10.1109/TED.2020.3043223
De Jong, M. J. , Salm, C. , & Schmitz, J. (2020). Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings Article 9129540 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE. https://doi.org/10.1109/IRPS45951.2020.9129540
Liakopoulou, A. , Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M. , Ravaioli, E. , Salm, C. , Schmitz, J. , & Verweij, A. P. (2020). Analysis of short-circuit transients in the LHC main dipole circuit. Journal of physics: Conference series, 1559(1), Article 012077. https://doi.org/10.1088/1742-6596/1559/1/012077
Smink, A. E. M. , de Jong, M. J. , Hilgenkamp, H. , Van Der Wiel, W. G. , & Schmitz, J. (2020). Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Article 9107901 (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107901
Gupta, G. (2020). Towards electrostatic doping approaches in ultra-thin body semiconductor materials and devices. [PhD Thesis - Research UT, graduation UT, University of Twente]. University of Twente. https://doi.org/10.3990/1.9789036550185
van Rijnbach, M. , Hueting, R. J. E., Stodolny, M., Janssen, G., Melskens, J. , & Schmitz, J. (2020). On the Accuracy of the Cox-Strack Equation and Method for Contact Resistivity Determination. IEEE Transactions on Electron Devices, 67(4), 1757-1763. Article 9031713. https://doi.org/10.1109/TED.2020.2974194
Ozturk, E. , Dikkers, M. J. , Batenburg, K. M. , Salm, C. , & Schmitz, J. (2020). RFID Tag Failure after Thermal Overstress. In 2019 IEEE International Integrated Reliability Workshop, IIRW 2019 Article 8989885 IEEE. https://doi.org/10.1109/IIRW47491.2019.8989885

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Education

For bachelor students, Schmitz teaches about the MOSFET in the electrical engineering program, about the Manhattan Project in the Honours program and about the Energy Transition in the minors.

For master students, he is the main teacher of the course Integrated Circuit Technology. He further teaches in the courses Solar Energy, Measurement Systems for Mechatronics, Technology, Fabrication of Nanostructures and Energy Conversion Systems.

Besides these, he supervises students for internships and BSc and MSc final projects.

Further, he is a member of the Honours Educational Quality Committee and of the UT-wide College van Beroep voor de Examens.

Affiliated Study Programmes

Bachelor

Master

Other

Courses Academic Year  2023/2024

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
 

Courses Academic Year  2022/2023

Contact Details

+31534897539  (if no answer)
 
 

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré (building no. 15), room C2617
Hallenweg 21
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré  C2617
P.O. Box 217
7500 AE Enschede
The Netherlands

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University of Twente Drienerlolaan 5
7522 NB Enschede
+31 (0)53 489 9111
info@utwente.nl
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