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prof.dr. J. Schmitz (Jurriaan)

Full Professor

About Me

Jurriaan Schmitz was born in Elst, The Netherlands in 1967. He received his M.Sc. (1990, cum laude) and Ph.D. (1994) degrees in Experimental Physics at the University of Amsterdam on research carried out at the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on new detectors for tracking and energy measurement of high-energy particles, the so-called MSGC and Spaghetti Calorimeter detectors. In this period he proposed the Micro Trench Gas Counter, employing constant-field rather than radial-field gas amplification, and the DME/CO2 gas mixture for miniaturized gaseous detectors.

After his Ph.D. he joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He worked on CMOS transistors from the 0,25 µm to the 90-nm node, studying super-steep retrograde wells, halo (pocket) implants, shallow junctions, GeSi gates, gate depletion and gate-last fabrication. Later he concentrated on characterization and reliability of CMOS devices, and studied the measurement issues arising from excessive gate leakage. He proposed the RF-CV characterization technique. He patented several new transistor architectures as well as inventions related to embedded flash memories and CMOS-APS image sensors.

In 2002 he became full professor at the University of Twente as the successor of Prof. Hans Wallinga. He expanded his research interests to include above-IC technologies and light-from-silicon. With his coworkers and PhD students he worked on a variety of topics such as energy harvesting microchips, radiation imaging detectors on CMOS, and RF-CMOS and RF-MEMS reliability. He currently heads a research group of 30 people and supervises 10 Ph.D. students.

He is technical program committee member of the European Solid-State Device Research Conference (ESSDERC). He acted as Technical Program Chair of the 2008 IEEE International Conference on Microelectronic Test Structures (ICMTS) and General Chairman of the same conference in 2011. He took part in the IEEE IEDM conference organization for 8 years total, including European Arrangements Co-Chair in 2012-2013. Also he was Editor of IEEE Electron Device Letters in 2013-2017. He served as board member of the Dutch Physical Society (NNV) and chaired the IEEE EDS chapter Benelux. He is a member of the Program Council of the Materials Innovation Institute (M2i).

Prof. Schmitz authored or co-authored over 220 journal and conference papers, 18 patents, and three book chapters.

Expertise

Physics & Astronomy
Chips
Cmos
Detectors
Engineering & Materials Science
Atomic Layer Deposition
Detectors
Hot Carriers
Silicon
Tungsten

Research

Jurriaan Schmitz was born in Elst, NL in 1967. He studied in Experimental Physics at the University of Amsterdam and the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on MSGC and Spaghetti Calorimeter. He proposed the Micro Trench Gas Counter; and the DME/CO2 gas mixture for miniaturized gaseous detectors. He joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He proposed the RF-CV characterization technique and patented several new transistor architectures. In 2002 he became full professor at the University of Twente. He expanded his research interests to include above-IC technologies and light-from-silicon. He worked on a variety of topics such as energy harvesting microchips, radiation imaging detectors on CMOS, and RF-CMOS and RF-MEMS reliability.

Publications

Recent
van Wijngaarden, B., Yang, J. , & Schmitz, J. (2022). Inaccuracies in contact resistivity from the Cox–Strack method: A review. Solar Energy Materials and Solar Cells, 246, 1-8. [111909]. https://doi.org/10.1016/j.solmat.2022.111909
Kettle, J., Aghaei, M., Ahmad, S., Fairbrother, A., Irvine, S., Jacobsson, J., Kazim, S., Kazukauskas, V., Lamb, D., Lobato, K., Mousdis, G. E. O. R. G. I. O. S., Oreski, G. , Reinders, A. , Schmitz, J. , Yilmaz, P., & Theelen, M. (Accepted/In press). Review of technology-specific degradation in c-Si, CdTe, CIGS, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies. Progress in Photovoltaics: Research and Applications. https://doi.org/10.1002/pip.3577
Yilmaz, P., Aninat, R., Cruz, G. O., Weber, T. , Schmitz, J., & Theelen, M. (2022). Post-mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation. Progress in Photovoltaics: Research and Applications, 30(6), 640-647. https://doi.org/10.1002/pip.3538
Aghaei, M., Fairbrother, A., Gok, A., Kazim, S., Lobato, K., Oreski, G. , Reinders, A. , Schmitz, J., Theelen, M. , Yilmaz, P., & Kettle, J. (2022). Review of degradation and failure phenomena in photovoltaic modules. Renewable and Sustainable Energy Reviews, 159, [112160]. https://doi.org/10.1016/j.rser.2022.112160
Yilmaz, P. , Schmitz, J., & Theelen, M. (2022). Potential induced degradation of CIGS PV systems: A literature review. Renewable and Sustainable Energy Reviews, 154, [111819]. https://doi.org/10.1016/j.rser.2021.111819
Vermeer, M. L. , Hueting, R. J. E., Pirro, L., Hoentschel, J. , & Schmitz, J. (2021). Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current. IEEE Transactions on Electron Devices, 68(2), 497-502. [9305941]. https://doi.org/10.1109/TED.2020.3043223
De Jong, M. J. , Salm, C. , & Schmitz, J. (2020). Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings [9129540] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2020-April). IEEE. https://doi.org/10.1109/IRPS45951.2020.9129540
Liakopoulou, A. , Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M. , Ravaioli, E. , Salm, C. , Schmitz, J. , & Verweij, A. P. (2020). Analysis of short-circuit transients in the LHC main dipole circuit. Journal of physics: Conference series, 1559(1), [012077]. https://doi.org/10.1088/1742-6596/1559/1/012077
Smink, A. E. M. , de Jong, M. J. , Hilgenkamp, H. , Van Der Wiel, W. G. , & Schmitz, J. (2020). Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) [9107901] (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107901
van Rijnbach, M. , Hueting, R. J. E., Stodolny, M., Janssen, G., Melskens, J. , & Schmitz, J. (2020). On the Accuracy of the Cox-Strack Equation and Method for Contact Resistivity Determination. IEEE Transactions on Electron Devices, 67(4), 1757-1763. [9031713]. https://doi.org/10.1109/TED.2020.2974194
ten Veldhuis, M-C., Uijlenhoet, R. , Schmitz, J., Smolders, B. , Nauta, B., Baltus, P., Makinwa, K., & Steeneken, P. (2019). Plantenna: towards a network of vegetation-integrated sensors for plant and environmental monitoring. Abstract from EGU General Assembly 2019, Vienna, Austria.
Liakopoulou, A. , Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M. , Ravaioli, E. , Salm, C. , Schmitz, J. , & Verweij, A. P. (2019). Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit. Abstract from 14th European Conference on Applied Superconductivity, EUCAS 2019, Glasgow, United Kingdom.
van der Zouw, K. , Aarnink, A. A. I. , Schmitz, J. , & Kovalgin, A. Y. (2019). Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films. In 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019 (pp. 48-53). [8730954] IEEE. https://doi.org/10.1109/ICMTS.2019.8730954
Agarwal, V. , Dutta, S. , Annema, A. J. , Hueting, R. J. E. , Schmitz, J., Lee, M-J., Charbon, E. , & Nauta, B. (2018). Optocoupling in CMOS. In 2018 IEEE International Electron Devices Meeting (IEDM) IEEE. https://doi.org/10.1109/IEDM.2018.8614523
Puliyankot, V., Piccolo, G. , Hueting, R. J. E. , & Schmitz, J. (2018). Toward GHz Switching in SOI Light Emitting Diodes. IEEE Transactions on Electron Devices, 65(10), 4413-4420. [8457503]. https://doi.org/10.1109/TED.2018.2866517

UT Research Information System

Courses Academic Year  2022/2023

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.
 

Courses Academic Year  2021/2022

Contact Details

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré (building no. 15), room C2617
Hallenweg 23
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré  C2617
P.O. Box 217
7500 AE Enschede
The Netherlands

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