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K.M. Batenburg BSc (Kevin)

Supporting Staff

Expertise

Engineering & Materials Science
Boron
Chemical Vapor Deposition
Core Shell Nanoparticles
Diodes
Light Emission
Physical Vapor Deposition
Chemistry
Physical Vapour Deposition
Thermal Cycling

Publications

Recent
Krakers, M., Knezevic, T. , Batenburg, K. M. , Liu, X. , & Nanver, L. K. (2020). Diode design for studying material defect distributions with avalanche-mode light emission. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings Article 9107933 (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107933
Ozturk, E. , Dikkers, M. J. , Batenburg, K. M. , Salm, C. , & Schmitz, J. (2020). RFID Tag Failure after Thermal Overstress. In 2019 IEEE International Integrated Reliability Workshop, IIRW 2019 Article 8989885 IEEE. https://doi.org/10.1109/IIRW47491.2019.8989885

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré (building no. 15), room C2615
Hallenweg 21
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics and Computer Science
Carré  C2615
P.O. Box 217
7500 AE Enschede
The Netherlands