ir. M. Krakers (Max)



Engineering & Materials Science
Avalanche Diodes
Light Emission
Physics & Astronomy
Boron Atom


Krakers, M., Knezevic, T. , Batenburg, K. M. , Liu, X. , & Nanver, L. K. (2020). Diode design for studying material defect distributions with avalanche-mode light emission. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings Article 9107933 (IEEE International Conference on Microelectronic Test Structures; Vol. 2020). IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107933
Knezević, T. , Krakers, M. , & Nanver, L. K. (2020). Broadband PureGaB Ge-on-Si photodiodes responsive in the ultraviolet to near-infrared range. In S. Jiang, & M. J. F. Digonnet (Eds.), Optical Components and Materials XVII Article 112760I (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11276). SPIE. https://doi.org/10.1117/12.2546734
Krakers, M., Kneževic, T. , & Nanver, L. K. (2019). Reverse breakdown and light-emission patterns studied in Si PureB SPADs. In K. Skala, Z. Car, P. Pale, D. Huljenic, M. Janjic, M. Koricic, V. Sruk, S. Ribaric, T. G. Grbac, Z. Butkovic, M. Cicin-Sain, D. Skvorc, M. Mauher, S. Babic, S. Gros, B. Vrdoljak, & E. Tijan (Eds.), 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings (pp. 30-35). Article 8757007 IEEE. https://doi.org/10.23919/MIPRO.2019.8757007
Nanver, L. K. , Krakers, M., Knezevic, T., Karavidas, A., Boturchuk, I. , Agarwal, V. , Hueting, R. J. E. , Dutta, S. , & Annema, A. J. (2018). Investigation of light-emission and avalanche-current mechanisms in PureB SPAD devices. In Fifth Conference on Sensors, MEMS and Electro-Optical Systems 2018 (Vol. 11043). SPIE. https://doi.org/10.1117/12.2501598

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