University of Twente
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prof.dr.ir. R.N.J. Veldhuis (Raymond)

Full Professor

Expertise

Biometrics
Authentication
Face Recognition
Classifiers
Experiments
Fusion Reactions
Communication
Biometrics
Image Quality
Pattern Recognition

Organizations

Ancillary Activities

  • 20Face
    Adviseur 20Face
  • European Association for Biometrics
    Chairman of the Special Interest Group Academia
  • Werkgroep Informatie- en Communicatietheorie in de Benelux
    Penningmeester
  • GenKey SME producing biometric systems
    lid Scientific Advisory Board GenKey

Publications

Recent
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2018). Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks. IEEE transactions on information forensics and security, 13(1), 253-264. [8017453]. DOI: 10.1109/TIFS.2017.2746013
Zeinstra, C. G., Meuwly, D., Ruifrok, A. C., Veldhuis, R. N., & Spreeuwers, L. J. (2018). Forensic face recognition as a means to determine strength of evidence: A survey. Forensic Science Review, 30(1), 21-32.
Veldhuis, R. N. J. (2018). Gezichtsherkenning op lage resolutie: Toepassingen camerasurveillance. 4, 19-21. [4].
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2017). How Random Is a Classifier Given Its Area under Curve? In A. Brömme, C. Busch, A. Dantcheva, C. Rathgeb, & A. Uhl (Eds.), 2017 International Conference of the Biometrics Special Interest Group (BIOSIG): BIOSIG 2017 [8053509] Gesellschaft fur Informatik (GI). DOI: 10.23919/BIOSIG.2017.8053509
Zeinstra, C. G., Veldhuis, R. N. J., Spreeuwers, L. J., Ruifrok, A. C. C., & Meuwly, D. (2017). ForenFace: A unique annotated forensic facial image dataset and toolset. IET biometrics, 6(6), 487-494. DOI: 10.1049/iet-bmt.2016.0160
Zeinstra, C., Veldhuis, R., Spreeuwers, L., & Ruifrok, A. (2017). Manually annotated characteristic descriptors: Measurability and variability. In 2017 5th International Workshop on Biometrics and Forensics (IWBF 2017) [7935095] Institute of Electrical and Electronics Engineers Inc.. DOI: 10.1109/IWBF.2017.7935095
van Dam, C., Veldhuis, R. N. J., & Spreeuwers, L. J. (2016). Face reconstruction from image sequences for forensic face comparison. IET biometrics, 5(2), 140-146. DOI: 10.1049/iet-bmt.2015.0036
Kotzerke, J., Hao, H., Davis, S. A., Hayes, R., Spreeuwers, L. J., Veldhuis, R. N. J., & Horadam, K. J. (2016). Identification performance of evidential value estimation for ridge-based biometrics. EURASIP journal on information security, 2016(24), 1-10. DOI: 10.1186/s13635-016-0050-3
Zeinstra, C. G., Veldhuis, R. N. J., & Spreeuwers, L. J. (2016). Discriminating Power of FISWG Characteristic Descriptors Under Different Forensic Use Cases. 16429109. DOI: 10.1109/BIOSIG.2016.7736919
Susyanto, N., Veldhuis, R. N. J., Spreeuwers, L. J., & Klaassen, C. A. J. (2016). Two-step calibration method for multi-algorithm score-based face recognition systems by minimizing discrimination loss. 16252593. Paper presented at 9th IAPR International Conference on Biometrics, ICB 2016, Halmstad, Sweden.DOI: 10.1109/ICB.2016.7550094

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Contact Details

+31614346251  (mobile)
+31534893776  (if no answer)
 
 

Visiting Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling (building no. 11), room 4067
Hallenweg 19
7522NH  Enschede
The Netherlands

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Mailing Address

University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling  4067
P.O. Box 217
7500 AE Enschede
The Netherlands

Organizations

University of Twente Drienerlolaan 5
7522 NB Enschede
+31 (0)53 489 9111
info@utwente.nl
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