Expertise
Biometrics
Authentication
Face Recognition
Classifiers
Experiments
Fusion Reactions
Communication
Biometrics
Image Quality
Pattern Recognition
Organizations
Ancillary Activities
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20Face
Adviseur 20Face -
European Association for Biometrics
Chairman of the Special Interest Group Academia -
Werkgroep Informatie- en Communicatietheorie in de Benelux
Penningmeester -
GenKey SME producing biometric systems
lid Scientific Advisory Board GenKey
Publications
Recent
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2018). Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks. IEEE transactions on information forensics and security, 13(1), 253-264. [8017453]. DOI: 10.1109/TIFS.2017.2746013
Zeinstra, C. G., Meuwly, D., Ruifrok, A. C., Veldhuis, R. N., & Spreeuwers, L. J. (2018). Forensic face recognition as a means to determine strength of evidence: A survey. Forensic Science Review, 30(1), 21-32.
Veldhuis, R. N. J. (2018). Gezichtsherkenning op lage resolutie: Toepassingen camerasurveillance. Security management, 4, 19-21. [4].
Peng, Y., Spreeuwers, L., & Veldhuis, R. (2017). Low-resolution face alignment and recognition using mixed-resolution classifiers. IET biometrics, 6(6), 418-428. DOI: 10.1049/iet-bmt.2016.0026
Scherhag, U., Nautsch, A., Rathgeb, C., Gomez-Barrero, M., Veldhuis, R. N. J., Spreeuwers, L., ... Busch, C. (2017). Biometric Systems under Morphing Attacks: Assessment of Morphing Techniques and Vulnerability Reporting. In 2017 International Conference of the Biometrics Special Interest Group, BIOSIG 2017 [8053499] Gesellschaft für Informatik e.V.. DOI: 10.23919/BIOSIG.2017.8053499
Haasnoot, E., Verwey, W., Barnhoorn, J., Veldhuis, R., & Spreeuwers, L. J. (2017). Towards understanding behavioural biometric classifier performance over time and practice. Paper presented at 38th WIC Symposium on Information Theory in the Benelux 2017, Delft, Netherlands.
Zeinstra, C., Veldhuis, R., & Spreeuwers, L. (2017). How Random Is a Classifier Given Its Area under Curve? In A. Brömme, C. Busch, A. Dantcheva, C. Rathgeb, & A. Uhl (Eds.), 2017 International Conference of the Biometrics Special Interest Group (BIOSIG): BIOSIG 2017 [8053509] Gesellschaft für Informatik e.V.. DOI: 10.23919/BIOSIG.2017.8053509
Zeinstra, C. G., Veldhuis, R. N. J., Spreeuwers, L. J., Ruifrok, A. C. C., & Meuwly, D. (2017). ForenFace: A unique annotated forensic facial image dataset and toolset. IET biometrics, 6(6), 487-494. DOI: 10.1049/iet-bmt.2016.0160
Zeinstra, C., Veldhuis, R., Spreeuwers, L., & Ruifrok, A. (2017). Manually annotated characteristic descriptors: Measurability and variability. In 2017 5th International Workshop on Biometrics and Forensics (IWBF 2017) [7935095] Institute of Electrical and Electronics Engineers. DOI: 10.1109/IWBF.2017.7935095
UT Research Information System
Courses
Contact Details
Visiting Address
University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling
(building no. 11), room 4067
Hallenweg 19
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Zilverling
4067
P.O. Box 217
7500 AE Enschede
The Netherlands