Carré

dr.ir. R.W.E. van de Kruijs (Robbert)

Assistant Professor
TNW-NEM-XUV
Carré C2017
r.w.e.vandekruijs@utwente.nl
+31534894415
Business card

Expertise

  • Material Science

    • Reflectivity
    • Thin Films
    • Surface
    • Temperature

  • Chemistry

    • Liquid Film

  • Physics

    • Growth
    • Mirrors
    • Diffusivity

Organisations

Publications

2024

Structural pathways for ultrafast melting of optically excited thin polycrystalline Palladium films (2024)Acta materialia, 276. Article 120043. Antonowicz, J., Olczak, A., Sokolowski-Tinten, K., Zalden, P., Milov, I., Dzięgielewski, P., Bressler, C., Chapman, H. N., Chojnacki, M., Dłużewski, P., Rodriguez-Fernandez, A., Fronc, K., Gawełda, W., Georgarakis, K., Greer, A. L., Jacyna, I., van de Kruijs, R. W. E., Kamiński, R., Khakhulin, D., … Sobierajski, R.https://doi.org/10.1016/j.actamat.2024.120043Oxidation of thin film binary entropy alloys (2024)[Contribution to conference › Poster] NWO Physics 2024. Homsma, M., van den Beld, W., van de Kruijs, R. W. E. & Ackermann, M.

2023

Infrared emissivity of thin films based on molybdenum silicides with silicon (2023)[Contribution to conference › Poster] MESA+ Meeting 2023. Baskakov, A., Golsanamlou, Z., van de Kruijs, R. W. E., Bokdam, M., Sturm, J. M. & Ackermann, M.Chemical Interaction of Hydrogen Radicals (H*) with Transition Metal Nitrides (2023)The Journal of physical chemistry C, 127(36), 17770-17780. Rehman, A., Kruijs, R. W. E. v. d., Beld, W. T. E. v. d., Sturm, J. M. & Ackermann, M.https://doi.org/10.1021/acs.jpcc.3c04490Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12] (2023)Applied surface science, 618. Article 155765. Chen, J., Louis, E., Harmsen, R., Tsarfati, T., Wormeester, H., van Kampen, M., van Schaik, W., van de Kruijs, R. & Bijkerk, F.https://doi.org/10.1016/j.apsusc.2022.155765

2022

Surface and interface diffusion processes in nanoscale thin films (2022)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Chandrasekaran, A.https://doi.org/10.3990/1.9789036554763Fracture behavior and characterization of free-standing metal silicide thin films (2022)[Thesis › PhD Thesis - Research UT, graduation UT]. University of Twente. Shafikov, A.https://doi.org/10.3990/1.9789036554251Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model (2022)Nuclear instruments and methods in physics research. Section B : Beam interactions with materials and atoms, 520, 29-39. Phadke, P., Zameshin, A. A., Sturm, J. M., van de Kruijs, R. W. E. & Bijkerk, F.https://doi.org/10.1016/j.nimb.2022.03.016LEIS analysis of thin Cu films on Ru: an unexpected result on sputter intermixing (2022)[Contribution to conference › Poster] LEIS Workshop 2022 (Unpublished). Sturm, J. M., van de Kruijs, R. W. E., Phadke, P. & Ackermann, M.Relation between composition and fracture strength in off-stoichiometric metal silicide free-standing membranes (2022)Intermetallics, 144. Article 107531. Shafikov, A., van de Kruijs, R. W. E., Benschop, J. P. H., Schurink, B., van den Beld, W. T. E., Houweling, Z. S., Kooi, B. J., Ahmadi, M., de Graaf, S. & Bijkerk, F.https://doi.org/10.1016/j.intermet.2022.107531

Research profiles

Courses academic year 2024/2025

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.

Courses academic year 2023/2024

Address

University of Twente

Carré (building no. 15), room C2017
Hallenweg 23
7522 NH Enschede
Netherlands

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