Welcome...

dr.ir. R.W.E. van de Kruijs (Robbert)

Assistant Professor

Expertise

X Rays
Reflectance
Thin Films
Wavelengths
Mirrors
Laminates
Multilayers
Retarding

Publications

Recent
Makhotkin, I. A., Sobierajski, R., Chalupsky, J., Tiedtke, K., de Vries, G., Störmer, M., ... Enkisch, H. (2018). Experimental study of EUV-mirror radiation damage resistance under long term FEL exposures below the single shot damage threshold. Journal of synchrotron radiation, 25(1), 77-84. DOI: 10.1107/S1600577517017362
Philipsen, V., Luong, K. V., Souriau, L., Erdmann, A., Xu, D., Evanschitzky, P., ... Hendrickx, E. (2017). Reducing extreme ultraviolet mask three-dimensional effects by alternative metal absorbers. Journal of micro/nanolithography, MEMS, and MOEMS, 16(4), [041002]. DOI: 10.1117/1.JMM.16.4.041002
Philipsen, V., Luong, K. V., Souriau, L., Hendrickx, E., Erdmann, A., Xu, D., ... Reuter, C. (2017). Reducing EUV mask 3D effects by alternative metal absorbers. In Extreme Ultraviolet (EUV) Lithography VIII (Vol. 10143). [1014310] SPIE. DOI: 10.1117/12.2257929
Huber, S., Gullikson, E., Meyer-Ilse, J., Frye, C. D., Edgar, J. H., van de Kruijs, R. W. E., ... Prendergast, D. (2017). Detection of defect populations in superconductor boron subphosphide B12P2 through X-ray absorption spectroscopy. Journal of materials chemistry. A, 5(12), 5737-5749. DOI: 10.1039/C6TA10935G

UT Research Information System

Contact Details

Visiting Address

University of Twente
Faculty of Science and Technology
Carré (building no. 15), room 2017
Hallenweg 23
7522NH  Enschede
The Netherlands

Navigate to location

Mailing Address

University of Twente
Faculty of Science and Technology
Carré  2017
P.O. Box 217
7500 AE Enschede
The Netherlands