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Recent
van Nieuwkasteele-Bystrova, S. N., Smits, S. M., Kovalgin, A. Y., Wolters, R. A. M., Nanver, L. K., Schmitz, J., & Klootwijk, J. H. (2017). Dealing with Leakage Current in TLM and CTLM Structures with Vertical Junction Isolation. 1. Paper presented at 30th International conference on Microelectronic Test Structures, ICMTS 2017, Grenoble, France.
Schmitz, J., Kaleli, B., Kuipers, P., van den Berg, N., Smits, S. M., & Hueting, R. J. E. (2016). Interface trap density estimation in FinFETs from the subthreshold current. In 2016 International Conference on Microelectronic Test Structures (ICMTS) (pp. 164-167). (Proceedings Conference ICMTS). USA: IEEE. DOI: 10.1109/ICMTS.2016.7476199
Schön, R., Schmitz, J., Smits, S. M., Bilevych, Y., Bilevych, Y., & Bakel, van, N. (2015). Reliable cool-down of GridPix detectors for cryogenic applications. Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, 780, 100-106. DOI: 10.1016/j.nima.2015.01.075
van der Graaf, H., Aarnink, A. A. I., Aarts, A., van Bakel, N., Berbee, E., Berkien, A., ... Wyrsch, N. (2013). The gridpix detector: History and perspective. Modern physics letters. A, 28(28-13), 13400211-13400217. DOI: 10.1142/S021773231340021X
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University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
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(building no. 15), room C3433
Hallenweg 23
7522NH Enschede
The Netherlands
Mailing Address
University of Twente
Faculty of Electrical Engineering, Mathematics & Computer Science
Carré
C3433
P.O. Box 217
7500 AE Enschede
The Netherlands