Zilverling

T.T. Smit (Tijmen)

PhD Candidate
EEMCS-CS-CAES
Zilverling 5054
t.t.smit@utwente.nl
Business card

Tijmen holds a B.Sc. in Creative Technology and an M.Sc. in Embedded Systems from the University of Twente. During his master's program, he graduated from the CAES group, where he developed an innovative fault injection framework. This research experience paved the way for his current role as a Ph.D. candidate in the Dependable Computing Systems group within CAES, a collaborative initiative involving the University of Twente, ESA, and Technolution. Tijmen's research is centered on evaluating the reliability and security of (RISC-V) computer architectures and emerging technologies. He employs a comprehensive approach that spans every stage of hardware design, including simulation, FPGA emulation, and ASIC implementation, utilizing advanced techniques such as radiation hardness assurance and fault injection to ensure robust system performance.

Expertise

  • Computer Science

    • Field Programmable Gate Arrays
    • Fault Injection
    • Emulation
    • Bloom Filter

  • Engineering

    • Bit Error
    • Error Detection
    • Soft Error
    • Neutron Beam

Organisations

Publications

2026

Evaluation of FPGA Delay Injection Mechanisms for Small Delay Fault Analysis (2026)In Proceedings of the 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2026 (Proceedings of the International Symposium on On-Line Testing and Robust System Design, IOLTS; Vol. 2026). IEEE. Smit, T. T., Postema, D., Paasman, P. & Ottavi, M.https://doi.org/10.1109/IOLTS69666.2026.11633697Instruction Error Detection with Bloom Filters: Architecture, Radiation Testing and Fault Injection (2026)IEEE transactions on device and materials reliability. Article 11580390 (E-pub ahead of print/First online). Cishugi, E. S., Smit, T. T., Forlin, B., Cazzaniga, C., Chen, K.-H. & Ottavi, M.https://doi.org/10.1109/TDMR.2026.3707731

2025

Bloom Filters for Soft Error Detection: Neutron and Fault Injection Validation (2025)In 2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS). Article 11116913 (IEEE Symposium on On-Line Testing (IOLTS); Vol. 2025). IEEE Advancing Technology for Humanity. Cishugi, E. S., Smit, T. T., Forlin, B., Cazzaniga, C., Chen, K.-H. & Ottavi, M.https://doi.org/10.1109/IOLTS65288.2025.11116913

2024

An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores (2024)In 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Article 10753564. IEEE. Smit, T. T., Forlin, B. E., Chen, K.-H., Souvatzoglou, I., Psarakis, M. & Ottavi, M.https://doi.org/10.1109/DFT63277.2024.10753564

Research profiles

Courses academic year 2025/2026

Courses in the current academic year are added at the moment they are finalised in the Osiris system. Therefore it is possible that the list is not yet complete for the whole academic year.

Address

University of Twente

Zilverling (building no. 11), room 5054
Hallenweg 19
7522 NH Enschede
Netherlands

Navigate to location

Organisations

QR codeScan the QR code or
Download vCard