Expertise
Engineering & Materials Science
# Biometrics
# Cables
# Deep Learning
# Face Recognition
# Printing
Physics & Astronomy
# Biometrics
# Cables
# Inhomogeneity
Publications
Recent
Kelly, U. M.
, Spreeuwers, L.
, & Veldhuis, R. (2023).
Exploring Face De-Identification using Latent Spaces. In
2022 IEEE International Joint Conference on Biometrics, IJCB 2022 (pp. 1-7). Article 10007990 (IEEE International Joint Conference on Biometrics (IJCB); Vol. 2022). IEEE.
https://doi.org/10.1109/IJCB54206.2022.10007990
Kelly, U. M.
, Spreeuwers, L.
, & Veldhuis, R. N. J. (2022).
Worst-Case Morphs: a Theoretical and a Practical Approach. In A. Bromme, N. Damer, M. Gomez-Barrero, K. Raja, C. Rathgeb, A. F. Sequeira, M. Todisco, & A. Uhl (Eds.),
2022 International Conference of the Biometrics Special Interest Group (BIOSIG) IEEE.
https://doi.org/10.1109/BIOSIG55365.2022.9896965
Spreeuwers, L., Schils, M.
, Veldhuis, R.
, & Kelly, U. (2022).
Practical Evaluation of Face Morphing Attack Detection Methods. In C. Rathgeb, R. Tolosana, R. Vera-Rodriguez, & C. Busch (Eds.),
Handbook of Digital Face Manipulation and Detection: From DeepFakes to Morphing Attacks (pp. 351-365). (Advances in Computer Vision and Pattern Recognition). Springer.
https://doi.org/10.1007/978-3-030-87664-7_16
Wang, S.
, Kelly, U. M.
, & Veldhuis, R. N. J. (2021).
Gender Obfuscation through Face Morphing. In
Proceedings - 9th International Workshop on Biometrics and Forensics, IWBF 2021 Article 9465088 IEEE.
https://doi.org/10.1109/IWBF50991.2021.9465088
Kelly, U. M.
, Veldhuis, R. N. J.
, & Spreeuwers, L. (2020).
Improving deep-learning-based face recognition to increase robustness against morphing attacks. In D. C. Wyld, & J. Zizka (Eds.),
9th International Conference on Signal, Image Processing and Pattern Recognition (SPPR 2020), December 19 ~ 20, 2020, Sydney, Australia (Computer Science & Information Technology; Vol. 10, No. 19). Academy and Industry Research Collaboration Center (AIRCC).
https://doi.org/10.5121/csit.2020.101901
Kelly, U. M., Richter, S., Redenbach, C., Schladitz, K., Scheuerlein, C., Wolf, F., Ebermann, P., Lackner, F., Schoerling, D., & Meinel, D. (2018).
Nb3Sn Wire Shape and Cross-Sectional Area Inhomogeneity in Rutherford Cables.
IEEE transactions on applied superconductivity,
28(4), Article 8253533.
https://doi.org/10.1109/TASC.2018.2791637
Contact Details
Visiting Address
University of Twente
Drienerlolaan 5
7522 NB Enschede
The Netherlands
Mailing Address
University of Twente
P.O. Box 217
7500 AE Enschede
The Netherlands